Michael Albiez

Person

Aalen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 11,276,547
- Issue date Mar 15, 2022
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam apparatus having an aperture unit and method for sett...
- Patent number 11,139,140
- Issue date Oct 5, 2021
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,861,670
- Issue date Dec 8, 2020
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,522,321
- Issue date Dec 31, 2019
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the lens detection o...
- Patent number 10,068,744
- Issue date Sep 4, 2018
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus having a selectively positionabl...
- Patent number 9,741,528
- Issue date Aug 22, 2017
- Carl Zeiss Microscopy GmbH
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device and method for operating a particle beam device
- Patent number 9,354,188
- Issue date May 31, 2016
- Carl Zeiss Microscopy GmbH
- Michael Albiez
- G01 - MEASURING TESTING
Information Patent Grant
Aperture unit for a particle beam device
- Patent number 8,779,381
- Issue date Jul 15, 2014
- Carl Zeiss NTS GmbH
- Matthias Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for examining a surface of an object
- Patent number 8,481,933
- Issue date Jul 9, 2013
- Carl Zeiss Microscopy GmbH
- Michael Albiez
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam systems and methods
- Patent number 8,450,215
- Issue date May 28, 2013
- Carl Zeiss Microscopy GmbH
- Hubert Mantz
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam system
- Patent number 8,368,020
- Issue date Feb 5, 2013
- Carl Zeiss Microscopy GmbH
- Hubert Mantz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system
- Patent number 8,368,019
- Issue date Feb 5, 2013
- Carl Zeiss Microscopy GmbH
- Hubert Mantz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for processing a digital gray value image so that a reduced...
- Patent number 8,131,102
- Issue date Mar 6, 2012
- Carl Zeiss NTS GmbH
- Michael Albiez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for binarizing a digital gray value image to generate a bina...
- Patent number 8,064,714
- Issue date Nov 22, 2011
- Carl Zeiss NTS GmbH
- Michael Albiez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focusing and positioning device for a particle-optical raster micro...
- Patent number 7,888,643
- Issue date Feb 15, 2011
- Carl Zeiss NTS GmbH
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20210050178
- Publication date Feb 18, 2021
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20200135425
- Publication date Apr 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20180342368
- Publication date Nov 29, 2018
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE LENS DETECTION O...
- Publication number 20170154752
- Publication date Jun 1, 2017
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS HAVING A SELECTIVELY POSITIONABL...
- Publication number 20150348742
- Publication date Dec 3, 2015
- CARL ZEISS MICROSCOPY GMBH
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM DEVICE AND METHOD FOR OPERATING A PARTICLE BEAM DEVICE
- Publication number 20140070097
- Publication date Mar 13, 2014
- CARL ZEISS MICROSCOPY GMBH
- Michael Albiez
- G01 - MEASURING TESTING
Information Patent Application
Aperture unit for a particle beam device
- Publication number 20120112089
- Publication date May 10, 2012
- Matthias Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam System
- Publication number 20120025078
- Publication date Feb 2, 2012
- CARL ZEISS NTS GMBH
- Hubert Mantz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam System
- Publication number 20120025077
- Publication date Feb 2, 2012
- CARL ZEISS NTS GMBH
- Hubert Mantz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle beam apparatus having an aperture unit and method for sett...
- Publication number 20110049361
- Publication date Mar 3, 2011
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle beam systems and methods
- Publication number 20110031215
- Publication date Feb 10, 2011
- Hubert Mantz
- G01 - MEASURING TESTING
Information Patent Application
Particle beam system
- Publication number 20100200750
- Publication date Aug 12, 2010
- Hubert Mantz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for examining a surface of an object
- Publication number 20100102223
- Publication date Apr 29, 2010
- Michael Albiez
- G01 - MEASURING TESTING
Information Patent Application
Focusing and positioning device for a particle-optical raster micro...
- Publication number 20080315120
- Publication date Dec 25, 2008
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for binarizing a digital gray value image
- Publication number 20080044095
- Publication date Feb 21, 2008
- Michael Albiez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for processing a digital gray value image
- Publication number 20080013853
- Publication date Jan 17, 2008
- Michael Albiez
- G06 - COMPUTING CALCULATING COUNTING

Michael Albiez

Person

Patents Grantslast 30 patents

Charged particle optical apparatus for through-the-lens detection o...

Particle beam apparatus having an aperture unit and method for sett...

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the lens detection o...

Charged particle optical apparatus having a selectively positionabl...

Particle beam device and method for operating a particle beam device

Aperture unit for a particle beam device

Method and device for examining a surface of an object

Particle beam systems and methods

Particle beam system

Particle beam system

Method for processing a digital gray value image so that a reduced...

Method for binarizing a digital gray value image to generate a bina...

Focusing and positioning device for a particle-optical raster micro...

Patents Applicationslast 30 patents

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS HAVING A SELECTIVELY POSITIONABL...

PARTICLE BEAM DEVICE AND METHOD FOR OPERATING A PARTICLE BEAM DEVICE

Aperture unit for a particle beam device

Particle Beam System

Particle Beam System

Particle beam apparatus having an aperture unit and method for sett...

Particle beam systems and methods

Particle beam system

Method and device for examining a surface of an object

Focusing and positioning device for a particle-optical raster micro...

Method for binarizing a digital gray value image

Method for processing a digital gray value image