Michael Andrew Chieda

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Stratford, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Reticle sub-field thermal control
- Patent number 11,500,298
- Issue date Nov 15, 2022
- ASML Holding N.V.
- Eric Justin Monkman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Chucks and clamps for holding objects of a lithographic apparatus a...
- Patent number RE49066
- Issue date May 10, 2022
- ASML Holding N.V.
- Raymond Wilhelmus Louis Lafarre
Information Patent Grant
Apparatus for and method cleaning a support inside a lithography ap...
- Patent number 11,048,175
- Issue date Jun 29, 2021
- ASML Holding N.V.
- Victor Antonio Perez-Falcon
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Chucks and clamps for holding objects of a lithographic apparatus a...
- Patent number 10,324,383
- Issue date Jun 18, 2019
- ASML Holding N.V.
- Raymond Wilhelmus Louis Lafarre
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RETICLE SUB-FIELD THERMAL CONTROL
- Publication number 20220057723
- Publication date Feb 24, 2022
- ASML Holding N.V.
- Eric Justin MONKMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus for and Method Cleaning a Support Inside a Lithography Ap...
- Publication number 20200348606
- Publication date Nov 5, 2020
- ASML Holding N.V.
- Victor Antonio PEREZ-FALCON
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CHUCKS AND CLAMPS FOR HOLDING OBJECTS OF A LITHOGRAPHIC APPARATUS A...
- Publication number 20180321602
- Publication date Nov 8, 2018
- ASML Holding N.V.
- Raymond Wilhelmus Louis LAFARRE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Quantitative Reticle Distortion Measurement System
- Publication number 20150212425
- Publication date Jul 30, 2015
- ASML Holding N.V.
- Michael Andrew Chieda
- G01 - MEASURING TESTING