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Michael Angelo
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Menlo Park, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Source-detector synchronization in multiplexed secondary ion mass s...
Patent number
12,020,920
Issue date
Jun 25, 2024
IONpath, Inc.
David Stumbo
G01 - MEASURING TESTING
Information
Patent Grant
Ion beam focus adjustment
Patent number
11,764,045
Issue date
Sep 19, 2023
IONpath, Inc.
Harris Fienberg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Source-detector synchronization in multiplexed secondary ion mass s...
Patent number
11,056,331
Issue date
Jul 6, 2021
IONpath, Inc.
David Stumbo
G01 - MEASURING TESTING
Information
Patent Grant
Ion beam focus adjustment
Patent number
10,916,414
Issue date
Feb 9, 2021
IONpath, Inc.
Harris Fienberg
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...
Publication number
20220181137
Publication date
Jun 9, 2022
IONpath, Inc.
David Stumbo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION BEAM FOCUS ADJUSTMENT
Publication number
20210407781
Publication date
Dec 30, 2021
IONpath, Inc.
Harris Fienberg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...
Publication number
20190267227
Publication date
Aug 29, 2019
IONpath, Inc.
David Stumbo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION BEAM FOCUS ADJUSTMENT
Publication number
20190228958
Publication date
Jul 25, 2019
IONpath, Inc.
Harris Fienberg
G01 - MEASURING TESTING