Michael Anthony Shinosky

Person

Jericho, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electromigration testing of interconnect analogues having bottom-co...
- Patent number 9,851,397
- Issue date Dec 26, 2017
- GLOBALFOUNDRIES Inc.
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-planar field effect transistor test structure and lateral diele...
- Patent number 9,453,873
- Issue date Sep 27, 2016
- GLOBALFOUNDRIES Inc.
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Test structure, method and circuit for simultaneously testing time...
- Patent number 8,754,655
- Issue date Jun 17, 2014
- International Business Machines Corporation
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Grant
Structure including voltage controlled negative resistance
- Patent number 8,525,153
- Issue date Sep 3, 2013
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermally programmable anti-reverse engineering interconnects where...
- Patent number 7,843,062
- Issue date Nov 30, 2010
- International Business Machines Corporation
- Fen Chen
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method of making thermally programmable anti-reverse engineering in...
- Patent number 7,709,401
- Issue date May 4, 2010
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMIGRATION TESTING OF INTERCONNECT ANALOGUES HAVING BOTTOM-CO...
- Publication number 20160258998
- Publication date Sep 8, 2016
- GLOBALFOUNDRIES INC.
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
DEVICE STRUCTURE WITH NEGATIVE RESISTANCE CHARACTERISTICS
- Publication number 20160225919
- Publication date Aug 4, 2016
- GLOBALFOUNDRIES INC.
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-PLANAR FIELD EFFECT TRANSISTOR TEST STRUCTURE AND LATERAL DIELE...
- Publication number 20150198654
- Publication date Jul 16, 2015
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
DESIGN STRUCTURE INCLUDING VOLTAGE CONTROLLED NEGATIVE RESISTANCE
- Publication number 20130146940
- Publication date Jun 13, 2013
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE, METHOD AND CIRCUIT FOR SIMULTANEOUSLY TESTING TIME...
- Publication number 20130038334
- Publication date Feb 14, 2013
- International Business Machines Corporation
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Application
THERMALLY PROGRAMMABLE ANTI-REVERSE ENGINEERING INTERCONNECTS AND M...
- Publication number 20100133691
- Publication date Jun 3, 2010
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMALLY PROGRAMMABLE ANTI-REVERSE ENGINEERING INTERCONNECTS AND M...
- Publication number 20090212431
- Publication date Aug 27, 2009
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS

Michael Anthony Shinosky

Person

Patents Grantslast 30 patents

Electromigration testing of interconnect analogues having bottom-co...

Non-planar field effect transistor test structure and lateral diele...

Test structure, method and circuit for simultaneously testing time...

Structure including voltage controlled negative resistance

Thermally programmable anti-reverse engineering interconnects where...

Method of making thermally programmable anti-reverse engineering in...

Patents Applicationslast 30 patents

ELECTROMIGRATION TESTING OF INTERCONNECT ANALOGUES HAVING BOTTOM-CO...

DEVICE STRUCTURE WITH NEGATIVE RESISTANCE CHARACTERISTICS

NON-PLANAR FIELD EFFECT TRANSISTOR TEST STRUCTURE AND LATERAL DIELE...

DESIGN STRUCTURE INCLUDING VOLTAGE CONTROLLED NEGATIVE RESISTANCE

TEST STRUCTURE, METHOD AND CIRCUIT FOR SIMULTANEOUSLY TESTING TIME...

THERMALLY PROGRAMMABLE ANTI-REVERSE ENGINEERING INTERCONNECTS AND M...

THERMALLY PROGRAMMABLE ANTI-REVERSE ENGINEERING INTERCONNECTS AND M...