Michael Antonell

Follow

Person

Summerfield, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Chemical mechanical polishing of dual orientation polycrystalline m...
- Patent number 6,899,596
- Issue date May 31, 2005
- Agere Systems, INC
- Michael Antonell
- B24 - GRINDING POLISHING
Information Patent Grant
Method for detecting defects in a material and a system for accompl...
- Patent number 6,870,950
- Issue date Mar 22, 2005
- Agere Systems Inc.
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor manufacturing using modular substrates
- Patent number 6,713,409
- Issue date Mar 30, 2004
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for minimizing semiconductor wafer contamination
- Patent number 6,695,572
- Issue date Feb 24, 2004
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray system
- Patent number 6,606,371
- Issue date Aug 12, 2003
- Agere Systems Inc.
- Michael Antonell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Modular semiconductor substrates
- Patent number 6,534,851
- Issue date Mar 18, 2003
- Agere Systems, INC
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Chemical mechanical polishing of dual orientation polycrystalline m...
- Publication number 20030162481
- Publication date Aug 28, 2003
- Michael Antonell
- B24 - GRINDING POLISHING
Information Patent Application
Semiconductor manufacturing using modular substrates
- Publication number 20030107117
- Publication date Jun 12, 2003
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for minimizing semiconductor wafer contamination
- Publication number 20030063967
- Publication date Apr 3, 2003
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for detecting defects in a material and a system for accompl...
- Publication number 20020131631
- Publication date Sep 19, 2002
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
X-ray system
- Publication number 20010043667
- Publication date Nov 22, 2001
- Michael Antonell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING