Michael B. Doelle

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Compensation of stress effects on pressure sensor components
- Patent number 8,820,169
- Issue date Sep 2, 2014
- Silicon Microstructures, Inc.
- Richard J. August
- G01 - MEASURING TESTING
Information Patent Grant
Compensation of stress effects on pressure sensor components
- Patent number 8,402,835
- Issue date Mar 26, 2013
- Silicon Microstructures, Inc.
- Richard J. August
- G01 - MEASURING TESTING
Information Patent Grant
Sensor element placement for package stress compensation
- Patent number 8,132,465
- Issue date Mar 13, 2012
- Silicon Microstructures, Inc.
- Michael B. Doelle
- G01 - MEASURING TESTING
Information Patent Grant
Temperature extraction from a pressure sensor
- Patent number 8,082,796
- Issue date Dec 27, 2011
- Silicon Microstructures, Inc.
- Michael B. Doelle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPENSATION OF STRESS EFFECTS ON PRESSURE SENSOR COMPONENTS
- Publication number 20130341740
- Publication date Dec 26, 2013
- Silicon Microstructures, Inc.
- Richard J. August
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE EXTRACTION FROM A PRESSURE SENSOR
- Publication number 20130008255
- Publication date Jan 10, 2013
- Silicon Microstructures, Inc.
- Michael B. Doelle
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION OF STRESS EFFECTS ON PRESSURE SENSOR COMPONENTS
- Publication number 20120204653
- Publication date Aug 16, 2012
- Silicon Microstructures, Inc.
- Richard J. August
- G01 - MEASURING TESTING