Michael B. Roth

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Memory with post-packaging master die selection
- Patent number 11,868,252
- Issue date Jan 9, 2024
- Micron Technology, Inc.
- Evan C. Pearson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory with adjustable TSV delay
- Patent number 11,670,358
- Issue date Jun 6, 2023
- Micron Technology, Inc.
- John H. Gentry
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with TSV health monitor circuitry
- Patent number 11,393,790
- Issue date Jul 19, 2022
- Micron Technology, Inc.
- Dale H. Hiscock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory with adjustable TSV delay
- Patent number 11,145,352
- Issue date Oct 12, 2021
- Micron Technology, Inc.
- John H. Gentry
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for capturing data in a memory
- Patent number 8,913,448
- Issue date Dec 16, 2014
- Micron Technology, Inc.
- Robert Tamlyn
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for characterizing a delay locked loop
- Patent number 7,068,085
- Issue date Jun 27, 2006
- Micron Technology, Inc.
- Tyler J. Gomm
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for characterizing a delay locked loop
- Patent number 6,774,687
- Issue date Aug 10, 2004
- Micron Technology, Inc.
- Tyler J. Gomm
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
MEMORY WITH POST-PACKAGING MASTER DIE SELECTION
- Publication number 20240126692
- Publication date Apr 18, 2024
- Micron Technology, Inc.
- Evan C. Pearson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY WITH ADJUSTABLE TSV DELAY
- Publication number 20220028443
- Publication date Jan 27, 2022
- Micron Technology, Inc.
- John H. Gentry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY WITH POST-PACKAGING MASTER DIE SELECTION
- Publication number 20210173773
- Publication date Jun 10, 2021
- Micron Technology, Inc.
- Evan C. Pearson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY WITH ADJUSTABLE TSV DELAY
- Publication number 20210174859
- Publication date Jun 10, 2021
- Micron Technology, Inc.
- John H. Gentry
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH TSV HEALTH MONITOR CIRCUITRY
- Publication number 20210175208
- Publication date Jun 10, 2021
- Micron Technology, Inc.
- Dale H. Hiscock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUSES AND METHODS FOR CAPTURING DATA IN A MEMORY
- Publication number 20140119141
- Publication date May 1, 2014
- Micron Technology, Inc.
- Robert Tamlyn
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for characterizing a delay locked loop
- Publication number 20040232962
- Publication date Nov 25, 2004
- Tyler J. Gomm
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and apparatus for characterizing a delay locked loop
- Publication number 20030169084
- Publication date Sep 11, 2003
- Tyler J. Gomm
- H03 - BASIC ELECTRONIC CIRCUITRY

Michael B. Roth

Person

Patents Grantslast 30 patents

Memory with post-packaging master die selection

Memory with adjustable TSV delay

Memory with TSV health monitor circuitry

Memory with adjustable TSV delay

Apparatuses and methods for capturing data in a memory

Method and apparatus for characterizing a delay locked loop

Method and apparatus for characterizing a delay locked loop

Patents Applicationslast 30 patents

MEMORY WITH POST-PACKAGING MASTER DIE SELECTION

MEMORY WITH ADJUSTABLE TSV DELAY

MEMORY WITH POST-PACKAGING MASTER DIE SELECTION

MEMORY WITH ADJUSTABLE TSV DELAY

MEMORY WITH TSV HEALTH MONITOR CIRCUITRY

APPARATUSES AND METHODS FOR CAPTURING DATA IN A MEMORY

Method and apparatus for characterizing a delay locked loop

Method and apparatus for characterizing a delay locked loop