Michael Ben-Yishai

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Natanya, IL

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Patents Grantslast 30 patents

Information Patent Grant
Detection of weak points of a mask
- Patent number 9,299,135
- Issue date Mar 29, 2016
- Applied Materials Israel, Ltd.
- Aviram Tam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for evaluating an evaluated pattern of a mask
- Patent number 8,098,926
- Issue date Jan 17, 2012
- Applied Materials Israel, Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for evaluating an object that has a repetitive pa...
- Patent number 7,970,577
- Issue date Jun 28, 2011
- Applied Materials Israel, Ltd.
- Shmuel Mangan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DETECTION OF WEAK POINTS OF A MASK
- Publication number 20140270468
- Publication date Sep 18, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Aviram Tam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING AN OBJECT THAT HAS A REPETITIVE PA...
- Publication number 20090240466
- Publication date Sep 24, 2009
- APPLIED MATERIALS ISRAEL, LTD.
- Shmuel Mangan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING AN EVALUATED PATTERN OF A MASK
- Publication number 20080166038
- Publication date Jul 10, 2008
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING