Michael Ben-Yishay

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Natanya, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for defect detection
- Patent number 8,238,647
- Issue date Aug 7, 2012
- Applied Materials Israel, Ltd.
- Michael Ben-Yishay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for aerial imaging of a reticle
- Patent number 8,213,024
- Issue date Jul 3, 2012
- Applied Materials Israel, Ltd.
- Shmuel Mangan
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for defect detection
- Patent number 7,970,201
- Issue date Jun 28, 2011
- Applied Materials Israel, Ltd.
- Michael Ben-Yishay
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR DEFECT DETECTION
- Publication number 20110255774
- Publication date Oct 20, 2011
- Michael Ben-Yishay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR DEFECT DETECTION
- Publication number 20080074659
- Publication date Mar 27, 2008
- Shmuel Mangan
- G01 - MEASURING TESTING
Information Patent Application
Method and system for defect detection
- Publication number 20080075355
- Publication date Mar 27, 2008
- Michael Ben-Yishay
- G06 - COMPUTING CALCULATING COUNTING