Michael Bienek

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor chip with thermal interface tape
- Patent number 9,627,281
- Issue date Apr 18, 2017
- Advanced Micro Device, Inc.
- Seth Prejean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus to achieve more level thermal gradient
- Patent number 7,991,955
- Issue date Aug 2, 2011
- Advanced Micro Devices, Inc.
- Michael D. Bienek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Over temperature detection apparatus and method thereof
- Patent number 7,650,550
- Issue date Jan 19, 2010
- GlobalFoundries Inc.
- Ravi Ramaswami
- G11 - INFORMATION STORAGE
Information Patent Grant
Zoned thermal monitoring
- Patent number 7,180,380
- Issue date Feb 20, 2007
- Advanced Micro Devices, Inc.
- Michael D. Bienek
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self timing test method and apparatus
- Patent number 6,867,613
- Issue date Mar 15, 2005
- Advanced Micro Devices, Inc.
- Michael D. Bienek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR CHIP WITH THERMAL INTERFACE TAPE
- Publication number 20120043539
- Publication date Feb 23, 2012
- Seth Prejean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVER TEMPERATURE DETECTION APPARATUS AND METHOD THEREOF
- Publication number 20080209291
- Publication date Aug 28, 2008
- Advanced Micro Devices, Inc.
- Ravi Ramaswami
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO ACHIEVE MORE LEVEL THERMAL GRADIENT
- Publication number 20080147976
- Publication date Jun 19, 2008
- Michael D. Bienek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Zoned thermal monitoring
- Publication number 20060238267
- Publication date Oct 26, 2006
- Advanced Micro Devices, Inc.
- Michael D. Bienek
- G01 - MEASURING TESTING