Michael C. Panis

Person

Brookline, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Bus synchronization system that aggregates status
- Patent number 10,896,106
- Issue date Jan 19, 2021
- Teradyne, Inc.
- Michael C. Panis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Jitter measurement algorithm using locally in-order strobes
- Patent number 7,668,235
- Issue date Feb 23, 2010
- Teradyne
- Michael Panis
- G01 - MEASURING TESTING
Information Patent Grant
Jitter frequency determining system
- Patent number 7,606,675
- Issue date Oct 20, 2009
- Teradyne, Inc.
- Michael Panis
- G01 - MEASURING TESTING
Information Patent Grant
Determining frequency components of jitter
- Patent number 7,519,490
- Issue date Apr 14, 2009
- Teradyne, Inc.
- Michael Panis
- G01 - MEASURING TESTING
Information Patent Grant
Determining frequency components of jitter
- Patent number 7,349,818
- Issue date Mar 25, 2008
- Teradyne, Inc.
- Michael Panis
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced loopback testing of serial devices
- Patent number 7,337,377
- Issue date Feb 26, 2008
- Teradyne, Inc.
- Michael C. Panis
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Enhanced loopback testing of serial devices
- Patent number 7,017,087
- Issue date Mar 21, 2006
- Teradyne, Inc.
- Michael C. Panis
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Deskewed differential detector employing analog-to-digital converter
- Patent number 6,981,192
- Issue date Dec 27, 2005
- Teradyne, Inc.
- Michael C. Panis
- G01 - MEASURING TESTING
Information Patent Grant
Pre-conditioner for measuring high-speed time intervals over a low-...
- Patent number 6,550,036
- Issue date Apr 15, 2003
- Teradyne, Inc.
- Michael C. Panis
- G01 - MEASURING TESTING
Information Patent Grant
Method for capturing digital data in an automatic test system
- Patent number 5,938,780
- Issue date Aug 17, 1999
- Teradyne, Inc.
- Michael C. Panis
- G01 - MEASURING TESTING
Information Patent Grant
High speed serial data pin for automatic test equipment
- Patent number 5,689,515
- Issue date Nov 18, 1997
- Teradyne, Inc.
- Michael C. Panis
- G01 - MEASURING TESTING
Information Patent Grant
Time linearity measurement using a frequency locked, dual sequencer...
- Patent number 5,604,751
- Issue date Feb 18, 1997
- Teradyne, Inc.
- Michael C. Panis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IDENTIFYING FAILURES IN DEVICE CORES
- Publication number 20240319261
- Publication date Sep 26, 2024
- Teradyne, Inc.
- Howard Lin
- G01 - MEASURING TESTING
Information Patent Application
BUS SYNCHRONIZATION SYSTEM
- Publication number 20190347175
- Publication date Nov 14, 2019
- Teradyne, Inc.
- Michael C. Panis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JITTER FREQUENCY DETERMINING SYSTEM
- Publication number 20080125991
- Publication date May 29, 2008
- Teradyne, Inc.
- Michael Panis
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING FREQUENCY COMPONENTS OF JITTER
- Publication number 20080117960
- Publication date May 22, 2008
- Teradyne, Inc.
- Michael Panis
- G01 - MEASURING TESTING
Information Patent Application
Jitter measurement algorithm using locally in-order strobes
- Publication number 20070118315
- Publication date May 24, 2007
- Teradyne, Inc.
- Michael Panis
- G01 - MEASURING TESTING
Information Patent Application
Determining frequency components of jitter
- Publication number 20070118316
- Publication date May 24, 2007
- Teradyne, Inc.
- Michael Panis
- G01 - MEASURING TESTING
Information Patent Application
Enhanced loopback testing of serial devices
- Publication number 20060123304
- Publication date Jun 8, 2006
- Michael C. Panis
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Deskewed differential detector employing analog-to-digital converter
- Publication number 20040064765
- Publication date Apr 1, 2004
- Michael C. Panis
- G01 - MEASURING TESTING
Information Patent Application
Enhanced loopback testing of serial devices
- Publication number 20020087924
- Publication date Jul 4, 2002
- Michael C. Panis
- G01 - MEASURING TESTING

Michael C. Panis

Person

Patents Grantslast 30 patents

Bus synchronization system that aggregates status

Jitter measurement algorithm using locally in-order strobes

Jitter frequency determining system

Determining frequency components of jitter

Determining frequency components of jitter

Enhanced loopback testing of serial devices

Enhanced loopback testing of serial devices

Deskewed differential detector employing analog-to-digital converter

Pre-conditioner for measuring high-speed time intervals over a low-...

Method for capturing digital data in an automatic test system

High speed serial data pin for automatic test equipment

Time linearity measurement using a frequency locked, dual sequencer...

Patents Applicationslast 30 patents

IDENTIFYING FAILURES IN DEVICE CORES

BUS SYNCHRONIZATION SYSTEM

JITTER FREQUENCY DETERMINING SYSTEM

DETERMINING FREQUENCY COMPONENTS OF JITTER

Jitter measurement algorithm using locally in-order strobes

Determining frequency components of jitter

Enhanced loopback testing of serial devices

Deskewed differential detector employing analog-to-digital converter

Enhanced loopback testing of serial devices