Michael C. Triplett

Person

Colchester, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method to eliminate arsenic contamination in trench capacitors
- Patent number 7,521,748
- Issue date Apr 21, 2009
- International Business Machines Corporation
- Marshall J. Fleming, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate stacks
- Patent number 7,378,712
- Issue date May 27, 2008
- International Business Machines Corporation
- Dale W. Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to eliminate arsenic contamination in trench capacitors
- Patent number 7,294,554
- Issue date Nov 13, 2007
- International Business Machines Corporation
- Marshall J. Fleming, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modification of electrical properties for semiconductor wafers
- Patent number 7,205,216
- Issue date Apr 17, 2007
- International Business Machines Corporation
- Casey J. Grant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate stacks
- Patent number 7,157,341
- Issue date Jan 2, 2007
- International Business Machines Corporation
- Dale W. Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology for measuring and controlling film thickness profiles
- Patent number 6,864,189
- Issue date Mar 8, 2005
- International Business Machines Corporation
- Timothy S. Hayes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Incorporation of an impurity into a thin film
- Patent number 6,774,019
- Issue date Aug 10, 2004
- International Business Machines Corporation
- Charles Augustus Choate
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
METHOD TO ELIMINATE ARSENIC CONTAMINATION IN TRENCH CAPACITORS
- Publication number 20080050849
- Publication date Feb 28, 2008
- International Business Machines Corporation
- Marshall J. Fleming
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO ELIMINATE ARSENIC CONTAMINATION IN TRENCH CAPACITORS
- Publication number 20080035978
- Publication date Feb 14, 2008
- International Business Machines Corporation
- Marshall J. Fleming
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE STACKS
- Publication number 20070194385
- Publication date Aug 23, 2007
- Dale W. Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODIFICATION OF ELECTRICAL PROPERTIES FOR SEMICONDUCTOR WAFERS
- Publication number 20070117404
- Publication date May 24, 2007
- Casey J. Grant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO ELIMINATE ARSENIC CONTAMINATION IN TRENCH CAPACITORS
- Publication number 20060091441
- Publication date May 4, 2006
- Marshall J. Fleming
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE STACKS
- Publication number 20060073688
- Publication date Apr 6, 2006
- International Business Machines Corporation
- Dale W. Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modification of electrical properties for semiconductor wafers
- Publication number 20060024916
- Publication date Feb 2, 2006
- International Business Machines Corporation
- Casey J. Grant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODOLOGY FOR MEASURING AND CONTROLLING FILM THICKNESS PROFILES
- Publication number 20040266035
- Publication date Dec 30, 2004
- International Business Machines Corporation
- Timothy S Hayes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Incorporation of an impurity into a thin film
- Publication number 20040144313
- Publication date Jul 29, 2004
- International Business Machines Corporation
- Charles Augustus Choate
- C30 - CRYSTAL GROWTH
Information Patent Application
Incorporation of an impurity into a thin film
- Publication number 20030213433
- Publication date Nov 20, 2003
- International Business Machines Corporation
- Charles Augustus Choate
- C30 - CRYSTAL GROWTH

Michael C. Triplett

Person

Patents Grantslast 30 patents

Method to eliminate arsenic contamination in trench capacitors

Gate stacks

Method to eliminate arsenic contamination in trench capacitors

Modification of electrical properties for semiconductor wafers

Gate stacks

Methodology for measuring and controlling film thickness profiles

Incorporation of an impurity into a thin film

Patents Applicationslast 30 patents

METHOD TO ELIMINATE ARSENIC CONTAMINATION IN TRENCH CAPACITORS

METHOD TO ELIMINATE ARSENIC CONTAMINATION IN TRENCH CAPACITORS

GATE STACKS

MODIFICATION OF ELECTRICAL PROPERTIES FOR SEMICONDUCTOR WAFERS

METHOD TO ELIMINATE ARSENIC CONTAMINATION IN TRENCH CAPACITORS

GATE STACKS

Modification of electrical properties for semiconductor wafers

METHODOLOGY FOR MEASURING AND CONTROLLING FILM THICKNESS PROFILES

Incorporation of an impurity into a thin film

Incorporation of an impurity into a thin film