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Michael C. Zemek

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  • Rowlett, TX, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    High speed lead inspection system
    • Patent number 6,128,034
    • Issue date Oct 3, 2000
    • Semiconductor Technologies & Instruments, Inc.
    • Charles K. Harris
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Method and apparatus for inspecting a workpiece
    • Patent number 6,118,540
    • Issue date Sep 12, 2000
    • Semiconductor Technologies & Instruments, Inc.
    • Rajiv Roy
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Programmable lead conditioner
    • Patent number 5,777,886
    • Issue date Jul 7, 1998
    • Semiconductor Technologies & Instruments, Inc.
    • Michael D. Glucksman
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR