Michael Campbell

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Encinitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Reliability of vias and diagnosis by e-beam probing
- Patent number 6,573,735
- Issue date Jun 3, 2003
- QUALCOMM Incorporated
- William Xia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT AND METHOD FOR TESTING INSULATING MATERIAL
- Publication number 20120212245
- Publication date Aug 23, 2012
- QUALCOMM Incorporated
- Angelo Pinto
- G01 - MEASURING TESTING
Information Patent Application
Reliability of vias and diagnosis by E-beam probing
- Publication number 20020186028
- Publication date Dec 12, 2002
- William Xia
- G01 - MEASURING TESTING