Membership
Tour
Register
Log in
Michael Caradonna
Follow
Person
Los Altos, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Automatic test system with focused test hardware
Patent number
10,139,449
Issue date
Nov 27, 2018
Teradyne, Inc.
Michael A. Caradonna
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Interface for a test system
Patent number
9,063,170
Issue date
Jun 23, 2015
Teradyne, Inc.
Michael Caradonna
G01 - MEASURING TESTING
Information
Patent Grant
Portable manipulator for stackable semiconductor test system
Patent number
7,312,604
Issue date
Dec 25, 2007
Nextest Systems Corporation
Paul Trudeau
G01 - MEASURING TESTING
Information
Patent Grant
High fidelity electrical probe
Patent number
6,940,298
Issue date
Sep 6, 2005
Teradyne, Inc.
Theodore A. Gutfeldt
G01 - MEASURING TESTING
Information
Patent Grant
Manipulator apparatus with low-cost compliance
Patent number
6,722,215
Issue date
Apr 20, 2004
Michael Caradonna
G01 - MEASURING TESTING
Information
Patent Grant
Integrated test cell
Patent number
6,310,486
Issue date
Oct 30, 2001
Teradyne, Inc.
David Trevisan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC TEST SYSTEM WITH FOCUSED TEST HARDWARE
Publication number
20170212164
Publication date
Jul 27, 2017
Teradyne, Inc.
Michael A. Caradonna
G01 - MEASURING TESTING
Information
Patent Application
INTERFACE FOR A TEST SYSTEM
Publication number
20140184257
Publication date
Jul 3, 2014
Teradyne, Inc.
Michael Caradonna
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE MANIPULATOR FOR STACKABLE SEMICONDUCTOR TEST SYSTEM
Publication number
20080100322
Publication date
May 1, 2008
Nextest Systems Corporation
Paul Trudeau
G01 - MEASURING TESTING
Information
Patent Application
Portable manipulator for stackable semiconductor test system
Publication number
20070024296
Publication date
Feb 1, 2007
Nextest Systems Corporation
Paul Trudeau
G01 - MEASURING TESTING
Information
Patent Application
High fidelity electrical probe
Publication number
20040063229
Publication date
Apr 1, 2004
Theodore A. Gutfeldt
G01 - MEASURING TESTING
Information
Patent Application
Manipulator apparatus with low-cost compliance
Publication number
20030230155
Publication date
Dec 18, 2003
Michael Caradonna
G01 - MEASURING TESTING