MICHAEL CHEMAMA

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REHOVOT, IL

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Patents Grantslast 30 patents

Information Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
- Patent number 11,953,316
- Issue date Apr 9, 2024
- Applied Materials Israel Ltd.
- Rafael Bistritzer
- G01 - MEASURING TESTING
Information Patent Grant
Time-domain optical metrology and inspection of semiconductor devices
- Patent number 11,366,398
- Issue date Jun 21, 2022
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20220390858
- Publication date Dec 8, 2022
- NOVA LTD
- GILAD BARAK
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL RECONSTRUCTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220082376
- Publication date Mar 17, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20210247699
- Publication date Aug 12, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- G01 - MEASURING TESTING