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Michael D. Bulatowicz
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Canoga Park, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Vapor cell for atomic physics sensors
Patent number
12,188,784
Issue date
Jan 7, 2025
Northrop Grumman Systems Corporation
Eric A. Imhof
G01 - MEASURING TESTING
Information
Patent Grant
Heater system with magnetic field suppression
Patent number
11,474,175
Issue date
Oct 18, 2022
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Synchronous light-pulse atomic magnetometer system
Patent number
11,294,005
Issue date
Apr 5, 2022
Northrop Grumman Systems Corporation
Thad G. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Pulsed-beam atomic magnetometer system
Patent number
10,823,790
Issue date
Nov 3, 2020
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Calibration of a magnetometer system
Patent number
10,809,342
Issue date
Oct 20, 2020
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Pulsed-beam atomic magnetometer system
Patent number
10,782,368
Issue date
Sep 22, 2020
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic self-calibration of an accelerometer system
Patent number
10,495,664
Issue date
Dec 3, 2019
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
Information
Patent Grant
Probe beam frequency stabilization in an atomic sensor system
Patent number
10,451,694
Issue date
Oct 22, 2019
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Customized magnetic susceptibility materials
Patent number
10,451,690
Issue date
Oct 22, 2019
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Optical pump beam control in a sensor system
Patent number
10,416,245
Issue date
Sep 17, 2019
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer sensor system
Patent number
10,330,696
Issue date
Jun 25, 2019
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Dynamic self-calibration of an accelerometer system
Patent number
10,126,324
Issue date
Nov 13, 2018
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
Information
Patent Grant
Combined electron paramagnetic resonance (EPR) and nuclear magnetic...
Patent number
10,060,993
Issue date
Aug 28, 2018
Northrop Grumman Guidance and Electronics Company, Inc.
Michael S. Larsen
G01 - MEASURING TESTING
Information
Patent Grant
Optical microphone system
Patent number
9,992,581
Issue date
Jun 5, 2018
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Nuclear magnetic resonance probe system
Patent number
9,970,999
Issue date
May 15, 2018
Northrop Grumman Systems Corporation
Michael S. Larsen
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic anomaly tracking for an inertial navigation system
Patent number
9,857,179
Issue date
Jan 2, 2018
Northrop Grumman Systems Corporation
Michael S. Larsen
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field trimming in an atomic sensor system
Patent number
9,829,544
Issue date
Nov 28, 2017
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Customized magnetic susceptibility materials
Patent number
9,810,751
Issue date
Nov 7, 2017
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Optical probe beam stabilization in an atomic sensor system
Patent number
9,778,328
Issue date
Oct 3, 2017
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Atomic sensor system
Patent number
9,726,494
Issue date
Aug 8, 2017
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic self-calibration of an accelerometer system
Patent number
9,702,897
Issue date
Jul 11, 2017
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance gyroscope system
Patent number
9,651,378
Issue date
May 16, 2017
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Combined electron paramagnetic resonance (EPR) and nuclear magnetic...
Patent number
9,645,205
Issue date
May 9, 2017
Northrop Grumman Guidance and Electronics Company, Inc.
Michael S. Larsen
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibrating nuclear magnetic resonance (NMR) gyroscope system
Patent number
9,618,362
Issue date
Apr 11, 2017
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Range-dependent bias calibration of an accelerometer sensor system
Patent number
9,612,256
Issue date
Apr 4, 2017
Northrop Grumman Guidance and Electronics Company, Inc.
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Range-dependent bias calibration of an accelerometer sensor system
Patent number
9,612,255
Issue date
Apr 4, 2017
Northrop Grumman Guidance and Electronic Company, Inc.
Michael D. Bulatowicz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Probe beam frequency stabilization in an atomic sensor system
Patent number
9,500,725
Issue date
Nov 22, 2016
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Optical accelerometer systems and method
Patent number
9,417,260
Issue date
Aug 16, 2016
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Optical accelerometer system
Patent number
9,285,390
Issue date
Mar 15, 2016
Northrop Grumman Systems Corporation
A. Douglas Meyer
G01 - MEASURING TESTING
Information
Patent Grant
Systems and method to substantially mitigate AC stark shift effects...
Patent number
9,229,073
Issue date
Jan 5, 2016
Northrop Grumman Guidance and Electronics Company, Inc.
Thad G. Walker
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ATOMIC SENSOR SYSTEM
Publication number
20230184553
Publication date
Jun 15, 2023
Northrop Grumman Systems Corporation
GORDON BARBOUR MORRISON
G01 - MEASURING TESTING
Information
Patent Application
VAPOR CELL FOR ATOMIC PHYSICS SENSORS
Publication number
20220196444
Publication date
Jun 23, 2022
Northrop Grumman Systems Corporation
ERIC A. IMHOF
G04 - HOROLOGY
Information
Patent Application
ATOMIC MAGNETOMETER SYSTEM
Publication number
20220018913
Publication date
Jan 20, 2022
Northrop Grumman Systems Corporation
THAD G. WALKER
G01 - MEASURING TESTING
Information
Patent Application
HEATER SYSTEM WITH MAGNETIC FIELD SUPPRESSION
Publication number
20210215779
Publication date
Jul 15, 2021
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
PROBE BEAM FREQUENCY STABILIZATION IN AN ATOMIC SENSOR SYSTEM
Publication number
20190293736
Publication date
Sep 26, 2019
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION OF A MAGNETOMETER SYSTEM
Publication number
20190101611
Publication date
Apr 4, 2019
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM
Publication number
20190049485
Publication date
Feb 14, 2019
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
Information
Patent Application
PULSED-BEAM ATOMIC MAGNETOMETER SYSTEM
Publication number
20180372813
Publication date
Dec 27, 2018
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
PULSED-BEAM ATOMIC MAGNETOMETER SYSTEM
Publication number
20180348313
Publication date
Dec 6, 2018
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
CUSTOMIZED MAGNETIC SUSCEPTIBILITY MATERIALS
Publication number
20180052211
Publication date
Feb 22, 2018
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
OPTICAL MICROPHONE SYSTEM
Publication number
20170280252
Publication date
Sep 28, 2017
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL PUMP BEAM CONTROL IN A SENSOR SYSTEM
Publication number
20170276741
Publication date
Sep 28, 2017
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETER SENSOR SYSTEM
Publication number
20170276698
Publication date
Sep 28, 2017
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM
Publication number
20170269122
Publication date
Sep 21, 2017
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
Information
Patent Application
COMBINED ELECTRON PARAMAGNETIC RESONANCE (EPR) AND NUCLEAR MAGNETIC...
Publication number
20170205476
Publication date
Jul 20, 2017
Northrop Grumman Systems Corporation
MICHAEL S. LARSEN
G01 - MEASURING TESTING
Information
Patent Application
SELF-CALIBRATING NUCLEAR MAGNETIC RESONANCE (NMR) GYROSCOPE SYSTEM
Publication number
20160202083
Publication date
Jul 14, 2016
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC ANOMALY TRACKING FOR AN INERTIAL NAVIGATION SYSTEM
Publication number
20160187142
Publication date
Jun 30, 2016
Northrop Grumman Systems Corporation
MICHAEL S. LARSEN
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PROBE BEAM STABILIZATION IN AN ATOMIC SENSOR SYSTEM
Publication number
20150346293
Publication date
Dec 3, 2015
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC SENSOR SYSTEM
Publication number
20150330786
Publication date
Nov 19, 2015
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD TRIMMING IN AN ATOMIC SENSOR SYSTEM
Publication number
20150316625
Publication date
Nov 5, 2015
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
CUSTOMIZED MAGNETIC SUSCEPTIBILITY MATERIALS
Publication number
20150241527
Publication date
Aug 27, 2015
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
NUCLEAR MAGNETIC RESONANCE GYROSCOPE SYSTEM
Publication number
20150241217
Publication date
Aug 27, 2015
NORTHROP GRUMMAN SYSTEMS CORPORATION
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ACCELEROMETER SYSTEMS AND METHOD
Publication number
20150160257
Publication date
Jun 11, 2015
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
PROBE BEAM FREQUENCY STABILIZATION IN AN ATOMIC SENSOR SYSTEM
Publication number
20150042327
Publication date
Feb 12, 2015
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
ATOM BEAM GYROSCOPE
Publication number
20150015251
Publication date
Jan 15, 2015
Michael D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
RANGE-DEPENDENT BIAS CALIBRATION OF AN ACCELEROMETER SENSOR SYSTEM
Publication number
20140236522
Publication date
Aug 21, 2014
NORTHROP GRUMMAN SYSTEMS CORPORATION
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
RANGE-DEPENDENT BIAS CALIBRATION OF AN ACCELEROMETER SENSOR SYSTEM
Publication number
20140230520
Publication date
Aug 21, 2014
Michael D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHOD TO SUBSTANTIALLY MITIGATE AC STARK SHIFT EFFECTS...
Publication number
20140184216
Publication date
Jul 3, 2014
THAD G. WALKER
G01 - MEASURING TESTING
Information
Patent Application
COMBINED ELECTRON PARAMAGNETIC RESONANCE (EPR) AND NUCLEAR MAGNETIC...
Publication number
20140159718
Publication date
Jun 12, 2014
MICHAEL S. LARSEN
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM
Publication number
20140096587
Publication date
Apr 10, 2014
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING