Michael David Fliesler

Person

Santa Cruz, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for dynamically detecting environmental condit...
- Patent number 8,271,810
- Issue date Sep 18, 2012
- Cypress Semiconductor Corporation
- Michael Fliesler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
3.5 transistor non-volatile memory cell using gate breakdown phenomena
- Patent number 7,173,851
- Issue date Feb 6, 2007
- Kilopass Technology, Inc.
- John M. Callahan
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and circuits for programming of a semiconductor memory cell...
- Patent number 7,042,772
- Issue date May 9, 2006
- Kilopass Technology, Inc.
- Jianguo Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and circuits for testing programmability of a semiconductor...
- Patent number 7,031,209
- Issue date Apr 18, 2006
- Kilopass Technology, Inc.
- Jianguo Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Combination field programmable gate array allowing dynamic reprogra...
- Patent number 6,972,986
- Issue date Dec 6, 2005
- Kilopass Technologies, Inc.
- Jack Zezhong Peng
- G11 - INFORMATION STORAGE
Information Patent Grant
High density semiconductor memory cell and memory array using a sin...
- Patent number 6,940,751
- Issue date Sep 6, 2005
- Kilopass Technologies, Inc.
- Jack Zezhong Peng
- G11 - INFORMATION STORAGE
Information Patent Grant
ESD implant following spacer deposition
- Patent number 6,900,085
- Issue date May 31, 2005
- Advanced Micro Devices, Inc.
- Mark T. Ramsbey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diode fabrication for ESD/EOS protection
- Patent number 6,770,938
- Issue date Aug 3, 2004
- Advanced Micro Devices, Inc.
- Michael Fliesler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoresist spacer process simplification to eliminate the standard...
- Patent number 6,440,789
- Issue date Aug 27, 2002
- Advanced Micro Devices, Inc.
- Darlene Hamilton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for achieving bond pad crater sensing and ESD...
- Patent number 6,395,568
- Issue date May 28, 2002
- Advanced Micro Devices, Inc.
- Richard C. Blish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving electrostatic discharge (ESD) robustness
- Patent number 6,238,975
- Issue date May 29, 2001
- Advanced Micro Devices, Inc.
- Michael David Fliesler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overerase correction for flash memory which limits overerase and pr...
- Patent number 5,642,311
- Issue date Jun 24, 1997
- Advanced Micro Devices
- Lee Cleveland
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Combination field programmable gate array allowing dynamic reprogra...
- Publication number 20050169039
- Publication date Aug 4, 2005
- Jack Zezhong Peng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Methods and circuits for programming of a semiconductor memory cell...
- Publication number 20040223370
- Publication date Nov 11, 2004
- Jianguo Wang
- G11 - INFORMATION STORAGE
Information Patent Application
Methods and circuits for testing programmability of a semiconductor...
- Publication number 20040208055
- Publication date Oct 21, 2004
- Jianguo Wang
- G11 - INFORMATION STORAGE
Information Patent Application
High density semiconductor memory cell and memory array using a sin...
- Publication number 20040156234
- Publication date Aug 12, 2004
- Jack Zezhong Peng
- G11 - INFORMATION STORAGE
Information Patent Application
ESD implant following spacer deposition
- Publication number 20020195663
- Publication date Dec 26, 2002
- Mark T. Ramsbey
- H01 - BASIC ELECTRIC ELEMENTS

Michael David Fliesler

Person

Patents Grantslast 30 patents

Method and apparatus for dynamically detecting environmental condit...

3.5 transistor non-volatile memory cell using gate breakdown phenomena

Methods and circuits for programming of a semiconductor memory cell...

Methods and circuits for testing programmability of a semiconductor...

Combination field programmable gate array allowing dynamic reprogra...

High density semiconductor memory cell and memory array using a sin...

ESD implant following spacer deposition

Diode fabrication for ESD/EOS protection

Photoresist spacer process simplification to eliminate the standard...

Method and apparatus for achieving bond pad crater sensing and ESD...

Method for improving electrostatic discharge (ESD) robustness

Overerase correction for flash memory which limits overerase and pr...

Patents Applicationslast 30 patents

Combination field programmable gate array allowing dynamic reprogra...

Methods and circuits for programming of a semiconductor memory cell...

Methods and circuits for testing programmability of a semiconductor...

High density semiconductor memory cell and memory array using a sin...

ESD implant following spacer deposition