Michael Downer

Follow

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for optically detecting and characterizing defect...
- Patent number 10,928,329
- Issue date Feb 23, 2021
- Board of Regents, The University of Texas System
- Farbod Shafiei
- G01 - MEASURING TESTING
Information Patent Grant
System and method for frequency domain interferometric second harmo...
- Patent number 6,411,388
- Issue date Jun 25, 2002
- Board of Regents The University of Texas System
- Michael W. Downer
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of an external silicon interface using optical sec...
- Patent number 5,557,409
- Issue date Sep 17, 1996
- Advanced Micro Devices Inc.
- Michael Downer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY DETECTING AND CHARACTERIZING DEFECT...
- Publication number 20190107495
- Publication date Apr 11, 2019
- Board of Regents, The University of Texas System
- Farbod Shafiei
- G01 - MEASURING TESTING