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Michael E. DUGAS
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Londonderry, NH, US
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Patents Grants
last 30 patents
Information
Patent Grant
Devices and methods for detecting elements in a sample
Patent number
11,187,664
Issue date
Nov 30, 2021
Thermo Scientific Portable Analytical Instruments Inc.
Pietro Caria
G01 - MEASURING TESTING
Information
Patent Grant
Portable laser induced breakdown spectroscopy systems
Patent number
10,718,716
Issue date
Jul 21, 2020
Thermo Scientific Portable Analytical Instruments Inc.
Peidong Wang
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic shaping time modification in X-ray detectors
Patent number
8,693,625
Issue date
Apr 8, 2014
Thermo Scientific Portable Analytical Instruments Inc.
Michael E. Dugas
G01 - MEASURING TESTING
Information
Patent Grant
Metal authenticity testing of an object using radiation
Patent number
8,515,009
Issue date
Aug 20, 2013
Thermo NITON Analyzers LLC
Stanislaw Piorek
G01 - MEASURING TESTING
Information
Patent Grant
Small spot X-ray fluorescence (XRF) analyzer
Patent number
7,916,834
Issue date
Mar 29, 2011
Thermo NITON Analyzers LLC
Stanislaw Piorek
G01 - MEASURING TESTING
Information
Patent Grant
Automated x-ray fluorescence analysis
Patent number
7,899,153
Issue date
Mar 1, 2011
Thermo NITON Analyzers LLC
Michael E. Dugas
G01 - MEASURING TESTING
Information
Patent Grant
Docking stand for analytical instrument
Patent number
7,875,847
Issue date
Jan 25, 2011
Thermo NITON Analyzers LLC
Michael E. Dugas
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DEVICES AND METHODS FOR DETECTING ELEMENTS IN A SAMPLE
Publication number
20210010957
Publication date
Jan 14, 2021
THERMO SCIENTIFIC PORTABLE ANALYTICAL INSTRUMENTS INC.
Pietro Caria
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE LASER INDUCED BREAKDOWN SPECTROSCOPY SYSTEMS
Publication number
20200300770
Publication date
Sep 24, 2020
Thermo Scientific Portable Analytical Instruments Inc.
Peidong Wang
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE LASER INDUCED BREAKDOWN SPECTROSCOPY SYSTEMS
Publication number
20190310201
Publication date
Oct 10, 2019
Thermo Scientific Portable Analytical Instruments Inc.
Peidong WANG
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE LASER INDUCED BREAKDOWN SPECTROSCOPY SYSTEMS
Publication number
20170023484
Publication date
Jan 26, 2017
Thermo Scientific Portable Analytical Instruments Inc.
Peidong WANG
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR IDENTIFICATION OF COUNTERFEIT GOLD JEWELRY US...
Publication number
20130202083
Publication date
Aug 8, 2013
Stanislaw Piorek
G01 - MEASURING TESTING
Information
Patent Application
METAL AUTHENTICITY TESTING OF AN OBJECT USING RADIATION
Publication number
20130202084
Publication date
Aug 8, 2013
THERMO NITON ANALYZERS LLC
Stanislaw Piorek
G01 - MEASURING TESTING
Information
Patent Application
Dynamic Shaping Time Modification in X-Ray Detectors
Publication number
20110211670
Publication date
Sep 1, 2011
Michael E. Dugas
G01 - MEASURING TESTING
Information
Patent Application
Small Spot X-Ray Fluorescence (XRF) Analyzer
Publication number
20110142200
Publication date
Jun 16, 2011
Stanislaw Piorek
G01 - MEASURING TESTING
Information
Patent Application
Automated X-Ray Fluorescence Analysis
Publication number
20090262889
Publication date
Oct 22, 2009
Michael E. DUGAS
G01 - MEASURING TESTING
Information
Patent Application
DOCKING STAND FOR ANALYTICAL INSTRUMENT
Publication number
20090057582
Publication date
Mar 5, 2009
Michael E. DUGAS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Contactless Memory Information Storage for Sample Analysis and Hand...
Publication number
20090057422
Publication date
Mar 5, 2009
Michael E. DUGAS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Analytical Instrument with Automatic Lockout against Unauthorized Use
Publication number
20090064276
Publication date
Mar 5, 2009
Michael E. DUGAS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SMALL SPOT X-RAY FLUORESCENCE (XRF) ANALYZER
Publication number
20080192897
Publication date
Aug 14, 2008
Stanislaw Piorek
G01 - MEASURING TESTING