Michael E. Fossey

Person

Charlotte, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection system for distinguishing pits and particles
- Patent number 6,509,965
- Issue date Jan 21, 2003
- ADE Optical Systems Corporation
- Michael E. Fossey
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system for distinguishing pits and particles
- Patent number 6,292,259
- Issue date Sep 18, 2001
- ADE Optical Systems Corporation
- Michael E. Fossey
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for identifying the material of a particle oc...
- Patent number 6,122,047
- Issue date Sep 19, 2000
- ADE Optical Systems Corporation
- John C. Stover
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system for distinguishing pits and particles
- Patent number 6,118,525
- Issue date Sep 12, 2000
- ADE Optical Systems Corporation
- Michael E. Fossey
- G01 - MEASURING TESTING
Information Patent Grant
Wafer transfer robot
- Patent number 5,988,971
- Issue date Nov 23, 1999
- ADE Optical Systems Corporation
- Michael E. Fossey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface inspection system and method of inspecting surface of workp...
- Patent number 5,712,701
- Issue date Jan 27, 1998
- ADE Optical Systems Corporation
- Lee D. Clementi
- G01 - MEASURING TESTING
Information Patent Grant
Smoke detector with digital display
- Patent number 5,565,852
- Issue date Oct 15, 1996
- Sentrol, Inc.
- Mark A. Peltier
- G08 - SIGNALLING

Patents Applicationslast 30 patents

Information Patent Application
Wafer inspection system for distinguishing pits and particles
- Publication number 20040085533
- Publication date May 6, 2004
- ADE Optical Systems Corporation
- Michael E. Fossey
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection system for distinguishing pits and particles
- Publication number 20030071992
- Publication date Apr 17, 2003
- ADE Optical Systems Corporation, a Massachusetts corporation
- Michael E. Fossey
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection system for distinguishing pits and particles
- Publication number 20010048523
- Publication date Dec 6, 2001
- ADE Optical Systems Corporation, a Massachusetts corporation
- Michael E. Fossey
- G01 - MEASURING TESTING

Michael E. Fossey

Person

Patents Grantslast 30 patents

Wafer inspection system for distinguishing pits and particles

Wafer inspection system for distinguishing pits and particles

Methods and apparatus for identifying the material of a particle oc...

Wafer inspection system for distinguishing pits and particles

Wafer transfer robot

Surface inspection system and method of inspecting surface of workp...

Smoke detector with digital display

Patents Applicationslast 30 patents

Wafer inspection system for distinguishing pits and particles

Wafer inspection system for distinguishing pits and particles

Wafer inspection system for distinguishing pits and particles