Michael E. Scaman

Person

Peekskill, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for testing pattern sensitive algorithms for semi...
- Patent number 8,201,132
- Issue date Jun 12, 2012
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Calibration of lithographic process models
- Patent number 8,174,681
- Issue date May 8, 2012
- International Business Machines Corporation
- Ioana Graur
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Calibration and verification structures for use in optical proximit...
- Patent number 8,161,421
- Issue date Apr 17, 2012
- International Business Machines Corporation
- Ramya Viswanathan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
MEEF reduction by elongation of square shapes
- Patent number 7,975,246
- Issue date Jul 5, 2011
- International Business Machines Corporation
- Derren Neylon Dunn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Ionization test for electrical verification
- Patent number 7,808,257
- Issue date Oct 5, 2010
- International Business Machines Corporation
- Christopher W. Cline
- G01 - MEASURING TESTING
Information Patent Grant
Testing pattern sensitive algorithms for semiconductor design
- Patent number 7,685,544
- Issue date Mar 23, 2010
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Iterative method for refining integrated circuit layout using compa...
- Patent number 7,673,279
- Issue date Mar 2, 2010
- International Business Machines Corporation
- Michael E. Scaman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Iterative method for refining integrated circuit layout using compa...
- Patent number 7,360,199
- Issue date Apr 15, 2008
- International Business Machines Corporation
- Michael E. Scaman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for testing pattern sensitive algorithms for semi...
- Patent number 7,353,472
- Issue date Apr 1, 2008
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wiring test structures for determining open and short circuits in s...
- Patent number 7,187,179
- Issue date Mar 6, 2007
- International Business Machines Corporation
- Michael E. Scaman
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure for reducing effects of noise and resonance as...
- Patent number 6,800,864
- Issue date Oct 5, 2004
- International Business Machines Corporation
- Michael Edward Scaman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for detection of electromechanical problems us...
- Patent number 6,785,615
- Issue date Aug 31, 2004
- International Business Machines Corporation
- Michael Edward Scaman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for detection and measurement of electrical an...
- Patent number 6,781,141
- Issue date Aug 24, 2004
- International Business Machines Corporation
- Michael Edward Scaman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal modulation system and method for locating a circuit defect
- Patent number 6,400,128
- Issue date Jun 4, 2002
- International Business Machines Corporation
- Daniel Guidotti
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting power plane-to-power plane shorts and I/O net-...
- Patent number 6,242,923
- Issue date Jun 5, 2001
- International Business Machines Corporation
- Michael E. Scaman
- G01 - MEASURING TESTING
Information Patent Grant
Thermal modulation system and method for locating a circuit defect...
- Patent number 6,236,196
- Issue date May 22, 2001
- International Business Machines Corporation
- Daniel Guidotti
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for locating power plane shorts using polarize...
- Patent number 6,141,093
- Issue date Oct 31, 2000
- International Business Machines Corporation
- Bernell E. Argyle
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for multi-stream detection of high density met...
- Patent number 6,005,966
- Issue date Dec 21, 1999
- International Business Machines Corporation
- Michael Edward Scaman
- G01 - MEASURING TESTING
Information Patent Grant
Simplified contactless test of MCM thin film I/O nets using a plasma
- Patent number 5,936,408
- Issue date Aug 10, 1999
- International Business Machines Corporation
- Michael E. Scaman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting shorts in a multi-layer electron...
- Patent number 5,821,759
- Issue date Oct 13, 1998
- International Business Machines Corporation
- Michael E. Scaman
- G01 - MEASURING TESTING
Information Patent Grant
Simplified contactless test of MCM thin film I/O nets using a plasma
- Patent number 5,818,239
- Issue date Oct 6, 1998
- International Business Machines Corporation
- Michael E. Scaman
- G01 - MEASURING TESTING
Information Patent Grant
Thin-film latent open optical detection with template-based feature...
- Patent number 5,448,650
- Issue date Sep 5, 1995
- International Business Machines Corporation
- Kamalesh Desai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CALIBRATION OF LITHOGRAPHIC PROCESS MODELS
- Publication number 20100171031
- Publication date Jul 8, 2010
- International Business Machines Corporation
- Ioana Graur
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMI...
- Publication number 20100095254
- Publication date Apr 15, 2010
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MEEF REDUCTION BY ELONGATION OF SQUARE SHAPES
- Publication number 20100042967
- Publication date Feb 18, 2010
- International Business Machines Corporation
- Derren N. Dunn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION AND VERIFICATAION STRUCTURES FOR USE IN OPTICAL PROXIMI...
- Publication number 20100005440
- Publication date Jan 7, 2010
- International Business Machines Corporation
- Ramya Viswanathan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Contact Level Mask Layouts By Introducing Anisotropic Sub-Resolutio...
- Publication number 20090191468
- Publication date Jul 30, 2009
- International Business Machines Corporation
- Michael M. Crouse
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ITERATIVE METHOD FOR REFINING INTEGRATED CIRCUIT LAYOUT USING COMPA...
- Publication number 20080141203
- Publication date Jun 12, 2008
- Michael E. Scaman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMICONDUCTOR DESIGN
- Publication number 20080104555
- Publication date May 1, 2008
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ITERATIVE METHOD FOR REFINING INTEGRATED CIRCUIT LAYOUT USING COMPA...
- Publication number 20070277145
- Publication date Nov 29, 2007
- International Business Machines Corporation
- Michael E. Scaman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Ionization test for electrical verification
- Publication number 20070108984
- Publication date May 17, 2007
- International Business Machines Corporation
- Christopher W. Cline
- G01 - MEASURING TESTING
Information Patent Application
System and method for testing pattern sensitive algorithms for semi...
- Publication number 20070038970
- Publication date Feb 15, 2007
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and structure for reducing effects of noise and resonance as...
- Publication number 20040079901
- Publication date Apr 29, 2004
- International Business Machines Corporation
- Michael Edward Scaman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure for detection of electromechanical problems us...
- Publication number 20040079896
- Publication date Apr 29, 2004
- International Business Machines Corporation
- Michael Edward Scaman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure for detection and measurement of electrical an...
- Publication number 20040079895
- Publication date Apr 29, 2004
- International Business Machines Corporation
- Michael Edward Scaman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Thermal modulation system and method for locating a circuit defect
- Publication number 20010035748
- Publication date Nov 1, 2001
- Daniel Guidotti
- G01 - MEASURING TESTING

Michael E. Scaman

Person

Patents Grantslast 30 patents

System and method for testing pattern sensitive algorithms for semi...

Calibration of lithographic process models

Calibration and verification structures for use in optical proximit...

MEEF reduction by elongation of square shapes

Ionization test for electrical verification

Testing pattern sensitive algorithms for semiconductor design

Iterative method for refining integrated circuit layout using compa...

Iterative method for refining integrated circuit layout using compa...

System and method for testing pattern sensitive algorithms for semi...

Wiring test structures for determining open and short circuits in s...

Method and structure for reducing effects of noise and resonance as...

Method and structure for detection of electromechanical problems us...

Method and structure for detection and measurement of electrical an...

Thermal modulation system and method for locating a circuit defect

Method for detecting power plane-to-power plane shorts and I/O net-...

Thermal modulation system and method for locating a circuit defect...

Method and apparatus for locating power plane shorts using polarize...

Method and apparatus for multi-stream detection of high density met...

Simplified contactless test of MCM thin film I/O nets using a plasma

Method and apparatus for detecting shorts in a multi-layer electron...

Simplified contactless test of MCM thin film I/O nets using a plasma

Thin-film latent open optical detection with template-based feature...

Patents Applicationslast 30 patents

CALIBRATION OF LITHOGRAPHIC PROCESS MODELS

SYSTEM AND METHOD FOR TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMI...

MEEF REDUCTION BY ELONGATION OF SQUARE SHAPES

CALIBRATION AND VERIFICATAION STRUCTURES FOR USE IN OPTICAL PROXIMI...

Contact Level Mask Layouts By Introducing Anisotropic Sub-Resolutio...

ITERATIVE METHOD FOR REFINING INTEGRATED CIRCUIT LAYOUT USING COMPA...

TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMICONDUCTOR DESIGN

ITERATIVE METHOD FOR REFINING INTEGRATED CIRCUIT LAYOUT USING COMPA...

Ionization test for electrical verification

System and method for testing pattern sensitive algorithms for semi...

Method and structure for reducing effects of noise and resonance as...

Method and structure for detection of electromechanical problems us...

Method and structure for detection and measurement of electrical an...

Thermal modulation system and method for locating a circuit defect