Michael F. O'Keeffe

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Medford, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Oscillator-based solid-state spin sensor
- Patent number 12,032,044
- Issue date Jul 9, 2024
- Massachusetts Institute of Technology
- Danielle A. Braje
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantum measurement emulation error mitigation protocol for quantum...
- Patent number 11,715,026
- Issue date Aug 1, 2023
- Massachusetts Institute of Technology
- William Oliver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microwave resonator readout of an ensemble solid state spin sensor
- Patent number 10,962,611
- Issue date Mar 30, 2021
- Massachusetts Institute of Technology
- John F. Barry
- G01 - MEASURING TESTING
Information Patent Grant
Stationary magic angle spinning enhanced solid state spin sensor
- Patent number 10,705,163
- Issue date Jul 7, 2020
- Massachusetts Institute of Technology
- John F. Barry
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
QUANTUM MEASUREMENT EMULATION ERROR MITIGATION PROTOCOL FOR QUANTUM...
- Publication number 20210406749
- Publication date Dec 30, 2021
- Massachusetts Institute of Technology
- William Oliver
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Oscillator-based Solid-State Spin Sensor
- Publication number 20210263117
- Publication date Aug 26, 2021
- Danielle A. Braje
- G01 - MEASURING TESTING
Information Patent Application
Microwave Resonator Readout of an Ensemble Solid State Spin Sensor
- Publication number 20210255258
- Publication date Aug 19, 2021
- Massachusetts Institute of Technology
- John F. Barry
- G01 - MEASURING TESTING
Information Patent Application
Microwave Resonator Readout of an Ensemble Solid State Spin Sensor
- Publication number 20200064419
- Publication date Feb 27, 2020
- John F. Barry
- G01 - MEASURING TESTING
Information Patent Application
Stationary Magic Angle Spinning Enhanced Solid State Spin Sensor
- Publication number 20190178958
- Publication date Jun 13, 2019
- John F. Barry
- G01 - MEASURING TESTING