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Michael Feser
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Orinda, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Compact storage ring extreme ultraviolet free electron laser
Patent number
10,193,300
Issue date
Jan 29, 2019
Lyncean Technologies, Inc.
Ronald D. Ruth
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Combined confocal X-ray fluorescence and X-ray computerised tomogra...
Patent number
9,739,729
Issue date
Aug 22, 2017
Carl Zeiss X-ray Microscopy, Inc.
Michael Feser
G01 - MEASURING TESTING
Information
Patent Grant
Stacked zone plates for pitch frequency multiplication
Patent number
9,640,291
Issue date
May 2, 2017
Carl Zeiss X-ray Microscopy, Inc.
Michael Feser
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Confocal XRF-CT system for mining analysis
Patent number
9,488,605
Issue date
Nov 8, 2016
Carl Zeiss X-ray Microscopy, Inc.
Michael Feser
G01 - MEASURING TESTING
Information
Patent Grant
Laboratory X-ray micro-tomography system with crystallographic grai...
Patent number
9,383,324
Issue date
Jul 5, 2016
Carl Zeiss X-ray Microscopy, Inc.
Michael Feser
G01 - MEASURING TESTING
Information
Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
Patent number
9,222,900
Issue date
Dec 29, 2015
Danmarks Tekniske Universitet of Anker Engelundsvej
Erik Mejdal Lauridsen
G01 - MEASURING TESTING
Information
Patent Grant
Laboratory x-ray micro-tomography system with crystallographic grai...
Patent number
9,110,004
Issue date
Aug 18, 2015
Carl Zeiss X-ray Microscopy, Inc.
Michael Feser
G01 - MEASURING TESTING
Information
Patent Grant
Compound x-ray lens having multiple aligned zone plates
Patent number
8,737,565
Issue date
May 27, 2014
Carl Zeiss X-ray Microscopy, Inc.
Alan Francis Lyon
G01 - MEASURING TESTING
Information
Patent Grant
Compound X-ray lens having multiple aligned zone plates
Patent number
8,526,575
Issue date
Sep 3, 2013
Xradia, Inc.
Alan Francis Lyon
G01 - MEASURING TESTING
Information
Patent Grant
Verification of integrated circuits against malicious circuit inser...
Patent number
8,139,846
Issue date
Mar 20, 2012
University of Southern California
Michael A. Bajura
G01 - MEASURING TESTING
Information
Patent Grant
Process for examining mineral samples with X-ray microscope and pro...
Patent number
8,068,579
Issue date
Nov 29, 2011
Xradia, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Grant
X-ray microscope with switchable x-ray source
Patent number
7,813,475
Issue date
Oct 12, 2010
Xradia, Inc.
Ziyu Wu
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Mechanism for switching sources in x-ray microscope
Patent number
7,796,725
Issue date
Sep 14, 2010
Xradia, Inc.
Ziyu Wu
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
System and method for quantitative reconstruction of Zernike phase-...
Patent number
7,787,588
Issue date
Aug 31, 2010
Xradia, Inc.
Wenbing Yun
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Structured anode X-ray source for X-ray microscopy
Patent number
7,443,953
Issue date
Oct 28, 2008
Xradia, Inc.
Wenbing Yun
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray microscope with microfocus source and Wolter condenser
Patent number
7,406,151
Issue date
Jul 29, 2008
Xradia, Inc.
Wenbing Yun
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Fabrication methods for micro compounds optics
Patent number
7,365,909
Issue date
Apr 29, 2008
Xradia, Inc.
Wenbing Yun
G02 - OPTICS
Information
Patent Grant
Fast x-ray lenses and fabrication method therefor
Patent number
7,365,918
Issue date
Apr 29, 2008
Xradia, Inc.
Wenbing Yun
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Patents Applications
last 30 patents
Information
Patent Application
COMPACT STORAGE RING EXTREME ULTRAVIOLET FREE ELECTRON LASER
Publication number
20190123507
Publication date
Apr 25, 2019
Lyncean Technologies, Inc.
Ronald D. Ruth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPACT STORAGE RING EXTREME ULTRAVIOLET FREE ELECTRON LASER
Publication number
20180241172
Publication date
Aug 23, 2018
Lyncean Technologies, Inc.
Ronald D. Ruth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Zone Plate and Method for Fabricating Same Using Conformal Coating
Publication number
20160086681
Publication date
Mar 24, 2016
CARL ZEISS X-RAY MICROSCOPY, INC.
Raymond Leung
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
LABORATORY X-RAY MICRO-TOMOGRAPHY SYSTEM WITH CRYSTALLOGRAPHIC GRAI...
Publication number
20150316493
Publication date
Nov 5, 2015
Michael Feser
G01 - MEASURING TESTING
Information
Patent Application
COMBINED CONFOCAL X-RAY FLUORESCENCE AND X-RAY COMPUTERISED TOMOGRA...
Publication number
20150253263
Publication date
Sep 10, 2015
CARL ZEISS X-RAY MICROSCOPY, INC.
Michael Feser
G01 - MEASURING TESTING
Information
Patent Application
Phase Contrast Imaging Using Patterned Illumination/Detector and Ph...
Publication number
20150055745
Publication date
Feb 26, 2015
CARL ZEISS X-RAY MICROSCOPY, INC.
Christian Holzner
G01 - MEASURING TESTING
Information
Patent Application
Stacked Zone Plates for Pitch Frequency Multiplication
Publication number
20140126703
Publication date
May 8, 2014
Michael Feser
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
LABORATORY X-RAY MICRO-TOMOGRAPHY SYSTEM WITH CRYSTALLOGRAPHIC GRAI...
Publication number
20140112433
Publication date
Apr 24, 2014
Michael Feser
G01 - MEASURING TESTING
Information
Patent Application
Confocal XRF-CT System for Mining Analysis
Publication number
20140072095
Publication date
Mar 13, 2014
Michael Feser
G01 - MEASURING TESTING
Information
Patent Application
VERIFICATION OF INTEGRATED CIRCUITS AGAINST MALICIOUS CIRCUIT INSER...
Publication number
20110002528
Publication date
Jan 6, 2011
University of Southern California
Michael A. Bajura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Fabrication Methods for Micro Compound Optics
Publication number
20080094694
Publication date
Apr 24, 2008
Xradia, Inc.
Wenbing Yun
G02 - OPTICS
Information
Patent Application
Tunable x-ray fluorescence imager for multi-element analysis
Publication number
20070108387
Publication date
May 17, 2007
Xradia, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Application
Back-end-of-line metallization inspection and metrology microscopy...
Publication number
20050282300
Publication date
Dec 22, 2005
Xradia, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Application
Fabrication methods for micro compound optics
Publication number
20040130785
Publication date
Jul 8, 2004
Xradia, Inc.
Wenbing Yun
G02 - OPTICS