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Michael Frederick Hayles
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Eindhoven, NL
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Patents Grants
last 30 patents
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Patent Grant
Sample preparation stage
Patent number
8,754,384
Issue date
Jun 17, 2014
FEI Company
Johannes A. H. W. G. Persoon
G01 - MEASURING TESTING
Information
Patent Grant
Forming an electron microscope sample from high-pressure frozen mat...
Patent number
8,674,323
Issue date
Mar 18, 2014
FEI Company
Rudolf Johannes Peter Gerardus Schampers
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for attaching a sample to a manipulator by melting and then...
Patent number
7,845,245
Issue date
Dec 7, 2010
FEI Company
Michael Frederick Hayles
G01 - MEASURING TESTING
Information
Patent Grant
Method of obtaining a particle-optical image of a sample in a parti...
Patent number
6,888,136
Issue date
May 3, 2005
FEI Company
Remco Theodorus Johannes Petrus Geurts
G01 - MEASURING TESTING
Information
Patent Grant
SEM for transmission operation with a location-sensitive detector
Patent number
6,376,839
Issue date
Apr 23, 2002
Philips Electron Optics
Michael F. Hayles
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
FORMING AN ELECTRON MICROSCOPE SAMPLE FROM HIGH-PRESSURE FROZEN MAT...
Publication number
20140014834
Publication date
Jan 16, 2014
Rudolf Johannes Peter Gerardus Schampers
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD FOR ATTACHING A SAMPLE TO A MANIPULATOR
Publication number
20090000400
Publication date
Jan 1, 2009
FEI Company
Michael Frederick Hayles
G02 - OPTICS
Information
Patent Application
Method of obtaining a particle-optical image of a sample in a parti...
Publication number
20040041094
Publication date
Mar 4, 2004
Remco Theodorus Johannes Petrus Geurts
G01 - MEASURING TESTING