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Michael Gordon
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Dallas, TX, US
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last 30 patents
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Patent Grant
Defect area consolidation for pattern inspector
Patent number
5,018,212
Issue date
May 21, 1991
Texas Instruments Incorporated
William G. Manns
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Target autoalignment for pattern inspector or writer
Patent number
4,969,200
Issue date
Nov 6, 1990
Texas Instruments Incorporated
William G. Manns
G06 - COMPUTING CALCULATING COUNTING