Membership
Tour
Register
Log in
Michael Grillberger
Follow
Person
Radebeul, DE
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Methods of forming 3-D integrated semiconductor devices having inte...
Patent number
10,014,279
Issue date
Jul 3, 2018
GLOBALFOUNDRIES Inc.
Thomas Werner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
3-D integrated semiconductor device comprising intermediate heat sp...
Patent number
9,318,468
Issue date
Apr 19, 2016
GLOBALFOUNDRIES Inc.
Thomas Werner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Assessing thermal mechanical characteristics of complex semiconduct...
Patent number
8,920,027
Issue date
Dec 30, 2014
GLOBALFOUNDRIES Inc.
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device comprising through hole vias having a stress r...
Patent number
8,598,714
Issue date
Dec 3, 2013
GLOBALFOUNDRIES Inc.
Torsten Huisinga
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reduction of mechanical stress in metal stacks of sophisticated sem...
Patent number
8,501,545
Issue date
Aug 6, 2013
GLOBALFOUNDRIES Inc.
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stress reduction in chip packaging by a stress compensation region...
Patent number
8,497,583
Issue date
Jul 30, 2013
GLOBALFOUNDRIES Inc.
Dmytro Chumakov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Assessing metal stack integrity in sophisticated semiconductor devi...
Patent number
8,479,578
Issue date
Jul 9, 2013
GLOBALFOUNDRIES Inc.
Holm Geisler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stress reduction in chip packaging by using a low-temperature chip-...
Patent number
8,482,123
Issue date
Jul 9, 2013
GLOBALFOUNDRIES Inc.
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sophisticated metallization systems in semiconductors formed by rem...
Patent number
8,399,335
Issue date
Mar 19, 2013
GLOBALFOUNDRIES, INC.
Torsten Huisinga
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reducing patterning variability of trenches in metallization layer...
Patent number
8,357,610
Issue date
Jan 22, 2013
GLOBALFOUNDRIES Inc.
Frank Feustel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
3-D integrated semiconductor device comprising intermediate heat sp...
Patent number
8,080,866
Issue date
Dec 20, 2011
GLOBALFOUNDRIES Inc.
Thomas Werner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device including stress relaxation gaps for enhancing...
Patent number
7,982,313
Issue date
Jul 19, 2011
Advanced Micro Devices, Inc.
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and test structure for monitoring CMP processes in metalliza...
Patent number
7,829,357
Issue date
Nov 9, 2010
GLOBALFOUNDRIES Inc.
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
REFLECTIVE SEMICONDUCTOR DEVICE WITH MIRROR ELEMENTS HAVING TWO OXI...
Publication number
20230402555
Publication date
Dec 14, 2023
GLOBALFOUNDRIES Dresden Module One Limited Liability Company & Co. KG
Thorsten E. Kammler
G02 - OPTICS
Information
Patent Application
METHODS OF FORMING 3-D INTEGRATED SEMICONDUCTOR DEVICES HAVING INTE...
Publication number
20160190104
Publication date
Jun 30, 2016
GLOBALFOUNDRIES INC.
Thomas Werner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REDUCING PATTERNING VARIABILITY OF TRENCHES IN METALLIZATION LAYER...
Publication number
20130130498
Publication date
May 23, 2013
GLOBALFOUNDRIES INC.
Frank Feustel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
3-D Integrated Semiconductor Device Comprising Intermediate Heat Sp...
Publication number
20120061818
Publication date
Mar 15, 2012
GLOBALFOUNDRIES INC.
Thomas Werner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Stress Reduction in Chip Packaging by Using a Low-Temperature Chip-...
Publication number
20120049350
Publication date
Mar 1, 2012
GLOBALFOUNDRIES INC.
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applying Thermal Mechanical Characteristics of Complex Semiconducto...
Publication number
20120051392
Publication date
Mar 1, 2012
GLOBALFOUNDRIES INC.
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sophisticated Metallization Systems in Semiconductors Formed by Rem...
Publication number
20120001343
Publication date
Jan 5, 2012
GLOBALFOUNDRIES INC.
Torsten Huisinga
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Device Comprising Through Hole Vias Having a Stress R...
Publication number
20120001330
Publication date
Jan 5, 2012
GLOBALFOUNDRIES INC.
Torsten Huisinga
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Stress Reduction in Chip Packaging by a Stress Compensation Region...
Publication number
20110291299
Publication date
Dec 1, 2011
GLOBALFOUNDRIES INC.
Dmytro Chumakov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Reduction of Mechanical Stress in Metal Stacks of Sophisticated Sem...
Publication number
20110244632
Publication date
Oct 6, 2011
GLOBALFOUNDRIES INC.
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ASSESSING METAL STACK INTEGRITY IN SOPHISTICATED SEMICONDUCTOR DEVI...
Publication number
20110209548
Publication date
Sep 1, 2011
Holm Geisler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE COMPRISING A CHIP INTERNAL ELECTRICAL TEST STR...
Publication number
20100252828
Publication date
Oct 7, 2010
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE COMPRISING A DISTRIBUTED INTERCONNECTED SENSOR...
Publication number
20100109005
Publication date
May 6, 2010
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
3-D INTEGRATED SEMICONDUCTOR DEVICE COMPRISING INTERMEDIATE HEAT SP...
Publication number
20100052134
Publication date
Mar 4, 2010
Thomas Werner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE INCLUDING STRESS RELAXATION GAPS FOR ENHANCING...
Publication number
20100052147
Publication date
Mar 4, 2010
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE COMPRISING METAL LINES WITH A SELECTIVELY FORM...
Publication number
20090294921
Publication date
Dec 3, 2009
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REDUCING PATTERNING VARIABILITY OF TRENCHES IN METALLIZATION LAYER...
Publication number
20090243116
Publication date
Oct 1, 2009
Frank Feustel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND TEST STRUCTURE FOR MONITORING CMP PROCESSES IN METALLIZA...
Publication number
20090140246
Publication date
Jun 4, 2009
Michael Grillberger
H01 - BASIC ELECTRIC ELEMENTS