Michael Hans Enzelberger-Heim

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Munich, DE

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Patents Grantslast 30 patents

Information Patent Grant
Multi-stacked capacitor
- Patent number 11,869,725
- Issue date Jan 9, 2024
- Texas Instruments Incorporated
- Michael Hans Enzelberger-Heim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dry etch process landing on metal oxide etch stop layer over metal...
- Patent number 11,195,725
- Issue date Dec 7, 2021
- Texas Instruments Incorporated
- Sebastian Meier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dry etch process landing on metal oxide etch stop layer over metal...
- Patent number 10,707,089
- Issue date Jul 7, 2020
- Texas Instruments Incorporated
- Sebastian Meier
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE WITH SLANTED FIELD PLATE
- Publication number 20250120157
- Publication date Apr 10, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Jonas Höhenberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CORRUGATED CAPACITOR
- Publication number 20250105135
- Publication date Mar 27, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Jonas HÖHENBERGER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-STACKED CAPACITOR
- Publication number 20230170153
- Publication date Jun 1, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Michael Hans ENZELBERGER-HEIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRY ETCH PROCESS LANDING ON METAL OXIDE ETCH STOP LAYER OVER METAL...
- Publication number 20200303202
- Publication date Sep 24, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Sebastian Meier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRY ETCH PROCESS LANDING ON METAL OXIDE ETCH STOP LAYER OVER METAL...
- Publication number 20190304796
- Publication date Oct 3, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Sebastian Meier
- G01 - MEASURING TESTING