Michael Hatzistergos

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Beacon, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method to improve semiconductor surfaces and polishing
- Patent number 9,252,050
- Issue date Feb 2, 2016
- International Business Machines Corporation
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to improve semiconductor surfaces and polishing
- Patent number 9,230,857
- Issue date Jan 5, 2016
- International Business Machines Corporation
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen handling apparatus
- Patent number 8,347,741
- Issue date Jan 8, 2013
- International Business Machines Corporation
- Michael Hatzistergos
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAILURE ANALYSIS APPARATUS USING X-RAYS
- Publication number 20210289610
- Publication date Sep 16, 2021
- GLOBALFOUNDRIES U.S. Inc.
- MICHAEL HATZISTERGOS
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD TO IMPROVE SEMICONDUCTOR SURFACES AND POLISHING
- Publication number 20150044869
- Publication date Feb 12, 2015
- International Business Machines Corporation
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO IMPROVE SEMICONDUCTOR SURFACES AND POLISHING
- Publication number 20140073131
- Publication date Mar 13, 2014
- STMicroelectronics, Inc.
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED METALLIC MICROTIP COUPON STRUCTURE FOR ATOM PROBE TOMOGR...
- Publication number 20120117696
- Publication date May 10, 2012
- International Business Machines Corporation
- Michael Hatzistergos
- B82 - NANO-TECHNOLOGY
Information Patent Application
SPECIMEN HANDLING APPARATUS
- Publication number 20110290039
- Publication date Dec 1, 2011
- International Business Machines Corporation
- Michael Hatzistergos
- G01 - MEASURING TESTING