Michael Howard

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Transition delay test function logic
- Patent number 8,356,221
- Issue date Jan 15, 2013
- Apple Inc.
- Mark T. Kuo
- G11 - INFORMATION STORAGE
Information Patent Grant
Device for thorough testing of secure electronic components
- Patent number 7,962,304
- Issue date Jun 14, 2011
- LSI Corporation
- Eric C. Pearson
- G01 - MEASURING TESTING
Information Patent Grant
Transition fault detection register with extended shift mode
- Patent number 7,334,172
- Issue date Feb 19, 2008
- LSI Logic Corporation
- Michael Howard
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Transition Delay Test Function Logic
- Publication number 20120054568
- Publication date Mar 1, 2012
- Mark T. Kuo
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR THOROUGH TESTING OF SECURE ELECTRONIC COMPONENTS
- Publication number 20090037133
- Publication date Feb 5, 2009
- Eric C. Pearson
- G01 - MEASURING TESTING
Information Patent Application
Methods and structure for scan testing of secure systems
- Publication number 20050066189
- Publication date Mar 24, 2005
- Robert Moss
- G01 - MEASURING TESTING