Michael I. McCully

Person

Houston, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
- Patent number 7,291,834
- Issue date Nov 6, 2007
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
- Patent number 7,145,134
- Issue date Dec 5, 2006
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
- Patent number 7,084,395
- Issue date Aug 1, 2006
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
- Patent number 7,019,286
- Issue date Mar 28, 2006
- Ionwerks, Inc.
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
- Patent number 6,909,090
- Issue date Jun 21, 2005
- Ionwerks
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
- Patent number 6,747,271
- Issue date Jun 8, 2004
- Ionwerks
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
- Patent number 6,683,299
- Issue date Jan 27, 2004
- Ionwerks
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20070018113
- Publication date Jan 25, 2007
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-flight mass spectrometer for monitoring of fast processes
- Publication number 20050127289
- Publication date Jun 16, 2005
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20040217275
- Publication date Nov 4, 2004
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-flight mass spectrometer for monitoring of fast processes
- Publication number 20040113064
- Publication date Jun 17, 2004
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20040046117
- Publication date Mar 11, 2004
- IONWERKS
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20030111597
- Publication date Jun 19, 2003
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-flight mass spectrometer for monitoring of fast processes
- Publication number 20030001087
- Publication date Jan 2, 2003
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS

Michael I. McCully

Person

Patents Grantslast 30 patents

Multi-anode detector with increased dynamic range for time-of-fligh...

Multi-anode detector with increased dynamic range for time-of-fligh...

Time-of-flight mass spectrometer for monitoring of fast processes

Time-of-flight mass spectrometer for monitoring of fast processes

Multi-anode detector with increased dynamic range for time-of-fligh...

Multi-anode detector with increased dynamic range for time-of-fligh...

Time-of-flight mass spectrometer for monitoring of fast processes

Patents Applicationslast 30 patents

Multi-anode detector with increased dynamic range for time-of-fligh...

Time-of-flight mass spectrometer for monitoring of fast processes

Multi-anode detector with increased dynamic range for time-of-fligh...

Time-of-flight mass spectrometer for monitoring of fast processes

Multi-anode detector with increased dynamic range for time-of-fligh...

Multi-anode detector with increased dynamic range for time-of-fligh...

Time-of-flight mass spectrometer for monitoring of fast processes