Michael J. Byrne

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East Aurora, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical configuration and method for differential refractive index...
- Patent number 6,734,956
- Issue date May 11, 2004
- Reichert, Inc.
- Michael J. Byrne
- G01 - MEASURING TESTING
Information Patent Grant
Optical configuration and method for differential refractive index...
- Patent number 6,717,663
- Issue date Apr 6, 2004
- Reichert, Inc.
- Robert C. Atkinson
- G01 - MEASURING TESTING
Information Patent Grant
Refractomer and method for qualitative and quantitative measurements
- Patent number 6,462,809
- Issue date Oct 8, 2002
- Leica Microsystems, Inc.
- Thomas E. Ryan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transmitted light refractometer
- Patent number 6,172,746
- Issue date Jan 9, 2001
- Leica Microsystems Inc.
- Michael J. Byrne
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for measuring the refractive index of at least...
- Publication number 20040075827
- Publication date Apr 22, 2004
- Leica Microsystems Inc.
- Michael Byrne
- G01 - MEASURING TESTING
Information Patent Application
Optical configuration and method for differential refractive index...
- Publication number 20030206290
- Publication date Nov 6, 2003
- Leica Microsystems Inc.
- Michael J. Byrne
- G01 - MEASURING TESTING
Information Patent Application
Optical configuration and method for differential refractive index...
- Publication number 20030206291
- Publication date Nov 6, 2003
- Leica Microsystems Inc.
- Michael J. Byrne
- G01 - MEASURING TESTING
Information Patent Application
Optical configuration and method for differential refractive index...
- Publication number 20030169417
- Publication date Sep 11, 2003
- Robert C. Atkinson
- G01 - MEASURING TESTING
Information Patent Application
Refractometer and method for qualitative and quantitative measurements
- Publication number 20030112427
- Publication date Jun 19, 2003
- Thomas E. Ryan
- G01 - MEASURING TESTING