Michael J. Darwin

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Interferometer and method for measuring characteristics of opticall...
- Patent number 7,948,636
- Issue date May 24, 2011
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and method for measuring characteristics of opticall...
- Patent number 7,684,049
- Issue date Mar 23, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for defect detection
- Patent number 7,539,583
- Issue date May 26, 2009
- Rudolph Technologies, Inc.
- Yonghang Fu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and method for measuring characteristics of opticall...
- Patent number 7,324,214
- Issue date Jan 29, 2008
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...
- Publication number 20100265516
- Publication date Oct 21, 2010
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...
- Publication number 20080266574
- Publication date Oct 30, 2008
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
Interferometer and method for measuring characteristics of opticall...
- Publication number 20070046953
- Publication date Mar 1, 2007
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
Method and system for defect detection
- Publication number 20060199287
- Publication date Sep 7, 2006
- Yonghang Fu
- G01 - MEASURING TESTING