Michael J. Fidrich

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Multiple beam and convergent light illumination crossed-beam imaging
- Patent number 11,300,492
- Issue date Apr 12, 2022
- Artium Technologies, Inc.
- William D. Bachalo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced detection through parsing records into signal components
- Patent number 11,029,241
- Issue date Jun 8, 2021
- Artium Technologies, Inc.
- William D. Bachalo
- G01 - MEASURING TESTING
Information Patent Grant
Particle field imaging and characterization using VCSEL lasers for...
- Patent number 10,705,001
- Issue date Jul 7, 2020
- Artium Technologies, Inc.
- William D. Bachalo
- G01 - MEASURING TESTING
Information Patent Grant
Multiple beam and convergent light illumination crossed-beam imaging
- Patent number 10,578,538
- Issue date Mar 3, 2020
- Artium Technologies, Inc.
- William D. Bachalo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for analysis and selection of encapsulated cellular materials
- Patent number 7,252,987
- Issue date Aug 7, 2007
- Islet Technology, Inc.
- William D. Bachalo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE BEAM AND CONVERGENT LIGHT ILLUMINATION CROSSED-BEAM IMAGING
- Publication number 20200182766
- Publication date Jun 11, 2020
- ARTIUM TECHNOLOGIES, INC.
- William D. BACHALO
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE FIELD IMAGING AND CHARACTERIZATION USING VCSEL LASERS FOR...
- Publication number 20190323938
- Publication date Oct 24, 2019
- Artium Technologies, Inc.
- William D. BACHALO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCED DETECTION THROUGH PARSING RECORDS INTO SIGNAL COMPONENTS
- Publication number 20160238510
- Publication date Aug 18, 2016
- Artium Technologies, Inc.
- William D. Bachalo
- G01 - MEASURING TESTING
Information Patent Application
System for analysis and selection of encapsulated cellular materials
- Publication number 20030232425
- Publication date Dec 18, 2003
- Islet Technology, Inc.
- William D. Bachalo
- G01 - MEASURING TESTING