Michael J. Mark

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Measuring concentrations of radicals in semiconductor processing
- Patent number 10,685,819
- Issue date Jun 16, 2020
- Applied Materials, Inc.
- Ramesh Gopalan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for controlling edge performance in an inducti...
- Patent number 8,999,106
- Issue date Apr 7, 2015
- Applied Materials, Inc.
- Wei Liu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEASURING CONCENTRATIONS OF RADICALS IN SEMICONDUCTOR PROCESSING
- Publication number 20180342377
- Publication date Nov 29, 2018
- Applied Materials, Inc.
- Ramesh GOPALAN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING EDGE PERFORMANCE IN AN INDUCTI...
- Publication number 20090162952
- Publication date Jun 25, 2009
- APPLIED MATERIALS, INC.
- Wei Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR PROCESSING A SUBSTRATE USING INDUCTIVELY C...
- Publication number 20090162570
- Publication date Jun 25, 2009
- APPLIED MATERIALS, INC.
- Johanes F. Swenberg
- H01 - BASIC ELECTRIC ELEMENTS