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Michael J. O'Neill
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Wilton, CT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Heater control circuit
Patent number
5,672,289
Issue date
Sep 30, 1997
The Perkin-Elmer Corporation
Michael J. O'Neill
G01 - MEASURING TESTING
Information
Patent Grant
Differential dielectric analyzer
Patent number
5,309,110
Issue date
May 3, 1994
The Perkin-Elmer Corporation
Michael J. O'Neill
G01 - MEASURING TESTING
Information
Patent Grant
High impedance current source
Patent number
5,225,766
Issue date
Jul 6, 1993
The Perkin-Elmer Corporation
Michael J. O'Neill
G01 - MEASURING TESTING
Information
Patent Grant
Circuit for heating and sensing with a single element
Patent number
5,098,196
Issue date
Mar 24, 1992
The Perkin-Elmer Corporation
Michael J. O'Neill
G01 - MEASURING TESTING
Information
Patent Grant
Circuitry for measuring phase difference between two oscillatory si...
Patent number
4,985,683
Issue date
Jan 15, 1991
The Perkin-Elmer Corporation
Michael J. O'Neill
G01 - MEASURING TESTING
Information
Patent Grant
Thermomechanical analysis apparatus
Patent number
4,896,973
Issue date
Jan 30, 1990
The Perkin-Elmer Corporation
Harold I. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Vertically stable friction-free microbalance
Patent number
4,625,819
Issue date
Dec 2, 1986
The Perkin-Elmer Corporation
Michael O'Neill
G01 - MEASURING TESTING
Information
Patent Grant
Liquid level sensor
Patent number
4,532,799
Issue date
Aug 6, 1985
The Perkin-Elmer Corporation
Michael J. O'Neill
G01 - MEASURING TESTING
Information
Patent Grant
Baseline control for a differential scanning calorimeter
Patent number
4,530,608
Issue date
Jul 23, 1985
The Perkin-Elmer Corp.
Michael J. O'Neill
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensor for a resistance furnace
Patent number
4,390,290
Issue date
Jun 28, 1983
The Perkin-Elmer Corporation
Michael J. O'Neill
G01 - MEASURING TESTING