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MICHAEL J. SZELEWSKI
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LOVELAND, CO, US
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Patents Grants
last 30 patents
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Patent Grant
In-situ conditioning in mass spectrometer systems
Patent number
8,513,593
Issue date
Aug 20, 2013
Agilent Technologies, Inc.
Bruce D. Quimby
G01 - MEASURING TESTING
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Patent Grant
Rapid automatic target compound confirmation using deconvolution an...
Patent number
7,117,103
Issue date
Oct 3, 2006
Agilent Technologies, Inc.
Michael Joseph Szelewski
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
IN-SITU CONDITIONING IN MASS SPECTROMETER SYSTEMS
Publication number
20130099113
Publication date
Apr 25, 2013
AGILENT TECHNOLOGIES, INC.
BRUCE D. QUIMBY
G01 - MEASURING TESTING
Information
Patent Application
ION SELECTION OPTIMIZATION FOR MASS SPECTROMETRY
Publication number
20120318970
Publication date
Dec 20, 2012
Bruce D. Quimby
G01 - MEASURING TESTING
Information
Patent Application
Rapid automatic target compound confirmation using deconvolution an...
Publication number
20050273276
Publication date
Dec 8, 2005
Michael Joseph Szelewski
G01 - MEASURING TESTING