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Michael J. Zunino
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Tempe, AZ, US
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Patents Grants
last 30 patents
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Patent Grant
Circuit for monitoring metal degradation on integrated circuit
Patent number
9,733,302
Issue date
Aug 15, 2017
NXP USA, INC.
Zhichen Zhang
G01 - MEASURING TESTING
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Patent Grant
Methods and apparatus for simulating distributed effects
Patent number
7,530,039
Issue date
May 5, 2009
FREESCALE SEMICONDUCTOR, INC.
Margaret L. Kniffin
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
CIRCUIT FOR MONITORING METAL DEGRADATION ON INTEGRATED CIRCUIT
Publication number
20160216318
Publication date
Jul 28, 2016
FREESCALE SEMICONDUCTOR, INC.
Zhichen Zhang
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for simulating distributed effects
Publication number
20070288882
Publication date
Dec 13, 2007
Margaret L. Kniffin
G06 - COMPUTING CALCULATING COUNTING