Michael James Owen

Person

Geebung, AU

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray spectroscopy in a charged-particle microscope
- Patent number 10,620,142
- Issue date Apr 14, 2020
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Grant
Automated mineral classification
- Patent number 9,778,215
- Issue date Oct 3, 2017
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mineral identification using sequential decomposition into elements...
- Patent number 9,734,986
- Issue date Aug 15, 2017
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample-specific reference spectra library
- Patent number 9,719,950
- Issue date Aug 1, 2017
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sub-pixel analysis and display of fine grained mineral samples
- Patent number 9,714,908
- Issue date Jul 25, 2017
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Blend modes for mineralogy images
- Patent number 9,495,786
- Issue date Nov 15, 2016
- FEI COMPAN
- Garth Howell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated EDS standards calibration
- Patent number 9,188,555
- Issue date Nov 17, 2015
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Grant
Blend modes for mineralogy images
- Patent number 9,183,656
- Issue date Nov 10, 2015
- FEI Company
- Garth Howell
- G01 - MEASURING TESTING
Information Patent Grant
Mineral identification using mineral definitions having composition...
- Patent number 9,091,635
- Issue date Jul 28, 2015
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Grant
Mineral identification using sequential decomposition into elements...
- Patent number 9,048,067
- Issue date Jun 2, 2015
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Grant
Mineral identification using mineral definitions including variability
- Patent number 8,937,282
- Issue date Jan 20, 2015
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for spectrum data analysis
- Patent number 8,880,356
- Issue date Nov 4, 2014
- FEI Company
- Daniel Roy Corbett
- G01 - MEASURING TESTING
Information Patent Grant
Cluster analysis of unknowns in SEM-EDS dataset
- Patent number 8,664,595
- Issue date Mar 4, 2014
- FEI Company
- Michael Buhot
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Multiple image segmentation and/or multiple dynamic spectral acquis...
- Publication number 20220319206
- Publication date Oct 6, 2022
- FEI Company
- Darius Kocár
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HI...
- Publication number 20220207256
- Publication date Jun 30, 2022
- FEI Company
- Michael James Owen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-Ray Spectroscopy in a charged-particle microscope
- Publication number 20190172681
- Publication date Jun 6, 2019
- FEI Company
- Michael James OWEN
- G01 - MEASURING TESTING
Information Patent Application
Sample-specific Reference Spectra Library
- Publication number 20160245762
- Publication date Aug 25, 2016
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
BLEND MODES FOR MINERALOGY IMAGES
- Publication number 20160063749
- Publication date Mar 3, 2016
- FEI Company
- Garth Howell
- G01 - MEASURING TESTING
Information Patent Application
Mineral Identification Using Sequential Decomposition into Elements...
- Publication number 20150338358
- Publication date Nov 26, 2015
- FFI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
Blend Modes for Mineralogy Images
- Publication number 20150262400
- Publication date Sep 17, 2015
- FEI Company
- Garth Howell
- G01 - MEASURING TESTING
Information Patent Application
Sub-pixel Analysis and Display of Fine Grained Mineral Samples
- Publication number 20150122992
- Publication date May 7, 2015
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MINERAL IDENTIFICATION USING SEQUENTIAL DECOMPOSITION INTO ELEMENTS...
- Publication number 20140117229
- Publication date May 1, 2014
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
Mineral Identification Using Mineral Definitions Including Variability
- Publication number 20140117230
- Publication date May 1, 2014
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
Automated Mineral Classification
- Publication number 20140117231
- Publication date May 1, 2014
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
Mineral Identification Using Mineral Definitions Having Composition...
- Publication number 20140117234
- Publication date May 1, 2014
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
Automated EDS Standards Calibration
- Publication number 20140032131
- Publication date Jan 30, 2014
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
CLUSTER ANALYSIS OF UNKNOWNS IN SEM-EDS DATASET
- Publication number 20140001356
- Publication date Jan 2, 2014
- FEI Company
- Michael Buhot
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Spectrum Data Analysis
- Publication number 20110144922
- Publication date Jun 16, 2011
- FEI Company
- Daniel Roy Corbett
- G01 - MEASURING TESTING

Michael James Owen

Person

Patents Grantslast 30 patents

X-ray spectroscopy in a charged-particle microscope

Automated mineral classification

Mineral identification using sequential decomposition into elements...

Sample-specific reference spectra library

Sub-pixel analysis and display of fine grained mineral samples

Blend modes for mineralogy images

Automated EDS standards calibration

Blend modes for mineralogy images

Mineral identification using mineral definitions having composition...

Mineral identification using sequential decomposition into elements...

Mineral identification using mineral definitions including variability

Method and system for spectrum data analysis

Cluster analysis of unknowns in SEM-EDS dataset

Patents Applicationslast 30 patents

Multiple image segmentation and/or multiple dynamic spectral acquis...

CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HI...

X-Ray Spectroscopy in a charged-particle microscope

Sample-specific Reference Spectra Library

BLEND MODES FOR MINERALOGY IMAGES

Mineral Identification Using Sequential Decomposition into Elements...

Blend Modes for Mineralogy Images

Sub-pixel Analysis and Display of Fine Grained Mineral Samples

MINERAL IDENTIFICATION USING SEQUENTIAL DECOMPOSITION INTO ELEMENTS...

Mineral Identification Using Mineral Definitions Including Variability

Automated Mineral Classification

Mineral Identification Using Mineral Definitions Having Composition...

Automated EDS Standards Calibration

CLUSTER ANALYSIS OF UNKNOWNS IN SEM-EDS DATASET

Method and System for Spectrum Data Analysis