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Michael James Owen
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Geebung, AU
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray spectroscopy in a charged-particle microscope
Patent number
10,620,142
Issue date
Apr 14, 2020
FEI Company
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Grant
Automated mineral classification
Patent number
9,778,215
Issue date
Oct 3, 2017
FEI Company
Michael James Owen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mineral identification using sequential decomposition into elements...
Patent number
9,734,986
Issue date
Aug 15, 2017
FEI Company
Michael James Owen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample-specific reference spectra library
Patent number
9,719,950
Issue date
Aug 1, 2017
FEI Company
Michael James Owen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sub-pixel analysis and display of fine grained mineral samples
Patent number
9,714,908
Issue date
Jul 25, 2017
FEI Company
Michael James Owen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Blend modes for mineralogy images
Patent number
9,495,786
Issue date
Nov 15, 2016
FEI COMPAN
Garth Howell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated EDS standards calibration
Patent number
9,188,555
Issue date
Nov 17, 2015
FEI Company
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Grant
Blend modes for mineralogy images
Patent number
9,183,656
Issue date
Nov 10, 2015
FEI Company
Garth Howell
G01 - MEASURING TESTING
Information
Patent Grant
Mineral identification using mineral definitions having composition...
Patent number
9,091,635
Issue date
Jul 28, 2015
FEI Company
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Grant
Mineral identification using sequential decomposition into elements...
Patent number
9,048,067
Issue date
Jun 2, 2015
FEI Company
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Grant
Mineral identification using mineral definitions including variability
Patent number
8,937,282
Issue date
Jan 20, 2015
FEI Company
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for spectrum data analysis
Patent number
8,880,356
Issue date
Nov 4, 2014
FEI Company
Daniel Roy Corbett
G01 - MEASURING TESTING
Information
Patent Grant
Cluster analysis of unknowns in SEM-EDS dataset
Patent number
8,664,595
Issue date
Mar 4, 2014
FEI Company
Michael Buhot
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Patents Applications
last 30 patents
Information
Patent Application
COMPOSITIONAL MAPPING EMPLOYING VARIABLE CHARGED PARTICLE BEAM PARA...
Publication number
20250208072
Publication date
Jun 26, 2025
FEI Company
Cody Levien
G01 - MEASURING TESTING
Information
Patent Application
ENERGY DISPERSIVE X-RAY SPECTROSCOPY PHASE SPECTRUM SYNTHESIS
Publication number
20250044245
Publication date
Feb 6, 2025
FEI Company
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Application
Multiple image segmentation and/or multiple dynamic spectral acquis...
Publication number
20220319206
Publication date
Oct 6, 2022
FEI Company
Darius Kocár
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HI...
Publication number
20220207256
Publication date
Jun 30, 2022
FEI Company
Michael James Owen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-Ray Spectroscopy in a charged-particle microscope
Publication number
20190172681
Publication date
Jun 6, 2019
FEI Company
Michael James OWEN
G01 - MEASURING TESTING
Information
Patent Application
Sample-specific Reference Spectra Library
Publication number
20160245762
Publication date
Aug 25, 2016
FEI Company
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Application
BLEND MODES FOR MINERALOGY IMAGES
Publication number
20160063749
Publication date
Mar 3, 2016
FEI Company
Garth Howell
G01 - MEASURING TESTING
Information
Patent Application
Mineral Identification Using Sequential Decomposition into Elements...
Publication number
20150338358
Publication date
Nov 26, 2015
FFI Company
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Application
Blend Modes for Mineralogy Images
Publication number
20150262400
Publication date
Sep 17, 2015
FEI Company
Garth Howell
G01 - MEASURING TESTING
Information
Patent Application
Sub-pixel Analysis and Display of Fine Grained Mineral Samples
Publication number
20150122992
Publication date
May 7, 2015
FEI Company
Michael James Owen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MINERAL IDENTIFICATION USING SEQUENTIAL DECOMPOSITION INTO ELEMENTS...
Publication number
20140117229
Publication date
May 1, 2014
FEI Company
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Application
Mineral Identification Using Mineral Definitions Including Variability
Publication number
20140117230
Publication date
May 1, 2014
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Application
Automated Mineral Classification
Publication number
20140117231
Publication date
May 1, 2014
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Application
Mineral Identification Using Mineral Definitions Having Composition...
Publication number
20140117234
Publication date
May 1, 2014
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Application
Automated EDS Standards Calibration
Publication number
20140032131
Publication date
Jan 30, 2014
FEI Company
Michael James Owen
G01 - MEASURING TESTING
Information
Patent Application
CLUSTER ANALYSIS OF UNKNOWNS IN SEM-EDS DATASET
Publication number
20140001356
Publication date
Jan 2, 2014
FEI Company
Michael Buhot
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Spectrum Data Analysis
Publication number
20110144922
Publication date
Jun 16, 2011
FEI Company
Daniel Roy Corbett
G01 - MEASURING TESTING