Michael K. Burkland

Person

Tucson, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Ultrasonic electro-optic seeker
- Patent number 10,788,291
- Issue date Sep 29, 2020
- Raytheon Company
- Michael K. Burkland
- F42 - AMMUNITION BLASTING
Information Patent Grant
Spherically constrained optical seeker assembly
- Patent number 10,338,187
- Issue date Jul 2, 2019
- Raytheon Company
- Michael K. Burkland
- F41 - WEAPONS
Information Patent Grant
Systems and methods for component identification
- Patent number 10,048,213
- Issue date Aug 14, 2018
- Raytheon Company
- Andrew M. Wilds
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Ultrasonic electro-optic seeker
- Patent number 9,952,019
- Issue date Apr 24, 2018
- Raytheon Company
- Michael K. Burkland
- F42 - AMMUNITION BLASTING
Information Patent Grant
Infrared spatial modulator for scene-based non-uniformity image cor...
- Patent number 8,872,111
- Issue date Oct 28, 2014
- Raytheon Company
- Michael K. Burkland
- F42 - AMMUNITION BLASTING
Information Patent Grant
Short-wave infrared based scope
- Patent number 8,800,870
- Issue date Aug 12, 2014
- Raytheon Company
- Michael K. Burkland
- F41 - WEAPONS
Information Patent Grant
Absolute position encoder
- Patent number 8,537,377
- Issue date Sep 17, 2013
- Raytheon Company
- Michael K. Burkland
- G01 - MEASURING TESTING
Information Patent Grant
Compact fixed-source array test station for calibration of a semi-a...
- Patent number 8,447,550
- Issue date May 21, 2013
- Rayheon Company
- Michael K. Burkland
- F41 - WEAPONS
Information Patent Grant
Fixed-source array test station for calibration of a semi-active la...
- Patent number 8,392,143
- Issue date Mar 5, 2013
- Raytheon Company
- Michael K. Burkland
- F41 - WEAPONS
Information Patent Grant
Molecular contaminant film modeling tool
- Patent number 7,514,275
- Issue date Apr 7, 2009
- Raytheon Company
- David Brooke Hatfield
- G01 - MEASURING TESTING
Information Patent Grant
Molecular contaminant film modeling tool
- Patent number 7,319,942
- Issue date Jan 15, 2008
- Raytheon Company
- David Brooke Hatfield
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Low-Temperature Deposition of High-Quality Aluminum Nitride Films f...
- Publication number 20210249331
- Publication date Aug 12, 2021
- The Regents of the University of California
- Scott Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRASONIC ELECTRO-OPTIC SEEKER
- Publication number 20190033037
- Publication date Jan 31, 2019
- Raytheon Company
- Michael K. Burkland
- F42 - AMMUNITION BLASTING
Information Patent Application
SPHERICALLY CONSTRAINED OPTICAL SEEKER ASSEMBLY
- Publication number 20180364324
- Publication date Dec 20, 2018
- Raytheon Company
- Michael K. Burkland
- F41 - WEAPONS
Information Patent Application
SYSTEMS AND METHODS FOR COMPONENT IDENTIFICATION
- Publication number 20180120239
- Publication date May 3, 2018
- Raytheon Company
- Andrew M. Wilds
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
ULTRASONIC ELECTRO-OPTIC SEEKER
- Publication number 20170254623
- Publication date Sep 7, 2017
- Raytheon Company
- Michael K. Burkland
- F41 - WEAPONS
Information Patent Application
SHORT-WAVE INFRARED BASED SCOPE
- Publication number 20140231514
- Publication date Aug 21, 2014
- Raytheon Company
- Michael K. Burkland
- F41 - WEAPONS
Information Patent Application
COMPACT FIXED-SOURCE ARRAY TEST STATION FOR CALIBRATION OF A SEMI-A...
- Publication number 20130110440
- Publication date May 2, 2013
- Raytheon Company
- Michael K. Burkland
- F41 - WEAPONS
Information Patent Application
ABSOLUTE POSITION ENCODER
- Publication number 20120274948
- Publication date Nov 1, 2012
- Raytheon Company
- MICHAEL K. BURKLAND
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SPATIAL MODULATOR FOR SCENE-BASED NON-UNIFORMITY IMAGE COR...
- Publication number 20120199689
- Publication date Aug 9, 2012
- Raytheon Company
- Michael K. Burkland
- F42 - AMMUNITION BLASTING
Information Patent Application
Fixed-Source Array Test Station for Calibration of a Semi-Active La...
- Publication number 20120143551
- Publication date Jun 7, 2012
- Raytheon Company
- Michael K. Burkland
- G01 - MEASURING TESTING
Information Patent Application
MOLECULAR CONTAINMENT FILM MODELING TOOL
- Publication number 20080124819
- Publication date May 29, 2008
- Raytheon Company
- David Brooke Hatfield
- G01 - MEASURING TESTING
Information Patent Application
Molecular contaminant film modeling tool
- Publication number 20050114101
- Publication date May 26, 2005
- David Brooke Hatfield
- G01 - MEASURING TESTING

Michael K. Burkland

Person

Patents Grantslast 30 patents

Ultrasonic electro-optic seeker

Spherically constrained optical seeker assembly

Systems and methods for component identification

Ultrasonic electro-optic seeker

Infrared spatial modulator for scene-based non-uniformity image cor...

Short-wave infrared based scope

Absolute position encoder

Compact fixed-source array test station for calibration of a semi-a...

Fixed-source array test station for calibration of a semi-active la...

Molecular contaminant film modeling tool

Molecular contaminant film modeling tool

Patents Applicationslast 30 patents

Low-Temperature Deposition of High-Quality Aluminum Nitride Films f...

ULTRASONIC ELECTRO-OPTIC SEEKER

SPHERICALLY CONSTRAINED OPTICAL SEEKER ASSEMBLY

SYSTEMS AND METHODS FOR COMPONENT IDENTIFICATION

ULTRASONIC ELECTRO-OPTIC SEEKER

SHORT-WAVE INFRARED BASED SCOPE

COMPACT FIXED-SOURCE ARRAY TEST STATION FOR CALIBRATION OF A SEMI-A...

ABSOLUTE POSITION ENCODER

INFRARED SPATIAL MODULATOR FOR SCENE-BASED NON-UNIFORMITY IMAGE COR...

Fixed-Source Array Test Station for Calibration of a Semi-Active La...

MOLECULAR CONTAINMENT FILM MODELING TOOL

Molecular contaminant film modeling tool