Michael Kammer

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Nashville, TN, US

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Patents Grantslast 30 patents

Information Patent Grant
Robust interferometer and methods of using same
- Patent number 11,293,863
- Issue date Apr 5, 2022
- Vanderbilt University
- Darryl J. Bornhop
- G01 - MEASURING TESTING
Information Patent Grant
Free-solution response function interferometry
- Patent number 11,143,649
- Issue date Oct 12, 2021
- Vanderbilt University
- Darryl J. Bornhop
- G01 - MEASURING TESTING
Information Patent Grant
Free-solution response function interferometry
- Patent number 10,627,396
- Issue date Apr 21, 2020
- Vanderbilt University
- Darryl J. Bornhop
- G01 - MEASURING TESTING
Information Patent Grant
Robust interferometer and methods of using same
- Patent number 10,261,013
- Issue date Apr 16, 2019
- Vanderbilt University
- Darryl J. Bornhop
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FREE-SOLUTION RESPONSE FUNCTION INTERFEROMETRY
- Publication number 20200209227
- Publication date Jul 2, 2020
- Vanderbilt University
- Darryl J. Bornhop
- G01 - MEASURING TESTING
Information Patent Application
Robust Interferometer and Methods of Using Same
- Publication number 20190178795
- Publication date Jun 13, 2019
- Vanderbilt University
- Darryl J. Bornhop
- G01 - MEASURING TESTING
Information Patent Application
FREE-SOLUTION RESPONSE FUNCTION INTERFEROMETRY
- Publication number 20190033301
- Publication date Jan 31, 2019
- Vanderbilt University
- Darryl J. Bornhop
- G01 - MEASURING TESTING
Information Patent Application
Robust Interferometer and Methods of Using Same
- Publication number 20160327480
- Publication date Nov 10, 2016
- Vanderbilt University
- Darryl J. Bornhop
- G01 - MEASURING TESTING