Michael KLOTS

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Givatayim, IL

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Patents Grantslast 30 patents

Information Patent Grant
Scatterometry method and system
- Patent number 10,302,414
- Issue date May 28, 2019
- Nova Measuring Instruments Ltd.
- Gilad Wainreb
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCATTEROMETRY METHOD AND SYSTEM
- Publication number 20160076876
- Publication date Mar 17, 2016
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad WAINREB
- G01 - MEASURING TESTING