Michael Kuchel

Person

Oberkochen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning interferometric methods and apparatus for measuring aspher...
- Patent number 7,948,638
- Issue date May 24, 2011
- Zygo Corporation
- Michael Küchel
- G01 - MEASURING TESTING
Information Patent Grant
Two grating lateral shearing wavefront sensor
- Patent number 7,889,356
- Issue date Feb 15, 2011
- Zygo Corporation
- Michael Küchel
- G01 - MEASURING TESTING
Information Patent Grant
Scanning interferometric methods and apparatus for measuring aspher...
- Patent number 7,612,893
- Issue date Nov 3, 2009
- Zygo Corporation
- Michael Küchel
- G01 - MEASURING TESTING
Information Patent Grant
Low coherence grazing incidence interferometry for profiling and ti...
- Patent number 7,289,224
- Issue date Oct 30, 2007
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Scanning interferometer for aspheric surfaces and wavefronts
- Patent number 7,218,403
- Issue date May 15, 2007
- Zygo Corporation
- Michael Küchel
- G01 - MEASURING TESTING
Information Patent Grant
Scanning interferometer for aspheric surfaces and wavefronts
- Patent number 6,972,849
- Issue date Dec 6, 2005
- Michael Küchel
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable interferometer system
- Patent number 6,943,896
- Issue date Sep 13, 2005
- Zygo Corporation
- Michael Küchel
- G01 - MEASURING TESTING
Information Patent Grant
Scanning interferometer for aspheric surfaces and wavefronts
- Patent number 6,879,402
- Issue date Apr 12, 2005
- Zygo Corporation
- Michael Küchel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for calibrating an interferometer using a sele...
- Patent number 6,816,267
- Issue date Nov 9, 2004
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Scanning interferometer for aspheric surfaces and wavefronts
- Patent number 6,781,700
- Issue date Aug 24, 2004
- Michael Küchel
- G01 - MEASURING TESTING
Information Patent Grant
Rapid in situ mastering of an aspheric Fizeau with residual error c...
- Patent number 6,734,979
- Issue date May 11, 2004
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Dispersive null-optics for aspheric surface and wavefront metrology
- Patent number 6,717,679
- Issue date Apr 6, 2004
- Zygo Corporation
- Michael Küchel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for phase-shifting interferometry
- Patent number 6,717,680
- Issue date Apr 6, 2004
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Grant
Rapid in-situ mastering of an aspheric fizeau
- Patent number 6,714,308
- Issue date Mar 30, 2004
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for phase evaluation of pattern images used in...
- Patent number 5,361,312
- Issue date Nov 1, 1994
- Carl-Zeiss-Stiftung
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating interferograms and interferometer therefor
- Patent number 5,357,341
- Issue date Oct 18, 1994
- Carl-Zeiss-Stiftung
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing periodic brightness patterns
- Patent number 5,343,294
- Issue date Aug 30, 1994
- Carl-Zeiss-Stiftung
- Michael Kuchel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for non-contact measuring of object surfaces
- Patent number 5,135,308
- Issue date Aug 4, 1992
- Carl Zeiss Stiftung
- Michael Kuchel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for non-contact measuring of object surfaces
- Patent number 5,135,309
- Issue date Aug 4, 1992
- Carl-Zeiss-Stiftung
- Michael Kuchel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for absolute interferometric testing of plane...
- Patent number 5,106,194
- Issue date Apr 21, 1992
- Carl-Zeiss-Stiftung
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Grant
Optical distance-measuring device
- Patent number 5,054,912
- Issue date Oct 8, 1991
- Carl-Zeiss-Stiftung
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Grant
Radiation source for partially coherent radiation
- Patent number 5,042,041
- Issue date Aug 20, 1991
- Carl-Zeiss-Stiftung
- Uwe Vry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometer for measuring optical phase differences
- Patent number 4,872,755
- Issue date Oct 10, 1989
- Carl-Zeiss-Stiftung
- Michael Kuchel
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
TWO GRATING LATERAL SHEARING WAVEFRONT SENSOR
- Publication number 20100141959
- Publication date Jun 10, 2010
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Application
Scanning Interferometric Methods and Apparatus for Measuring Aspher...
- Publication number 20100110446
- Publication date May 6, 2010
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Application
Scanning interferometric methods and apparatus for measuring aspher...
- Publication number 20080068613
- Publication date Mar 20, 2008
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Application
Scanning interferometer for aspheric surfaces and wavefronts
- Publication number 20050157311
- Publication date Jul 21, 2005
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Application
Reconfigurable interferometer system
- Publication number 20050083537
- Publication date Apr 21, 2005
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Application
Low coherence grazing incidence interferometry systems and methods
- Publication number 20050057757
- Publication date Mar 17, 2005
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Dispersive null-optics for aspheric surface and wavefront metrology
- Publication number 20030128368
- Publication date Jul 10, 2003
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Application
Scanning interferometer for aspheric surfaces and wavefronts
- Publication number 20030103215
- Publication date Jun 5, 2003
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for calibrating an interferometer using a sele...
- Publication number 20030090798
- Publication date May 15, 2003
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Application
Rapid in situ mastering of an aspheric fizeau with residual error c...
- Publication number 20030090678
- Publication date May 15, 2003
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Application
Rapid in-situ mastering of an aspheric fizeau
- Publication number 20030048457
- Publication date Mar 13, 2003
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Application
Scanning interferometer for aspheric surfaces and wavefronts
- Publication number 20030043385
- Publication date Mar 6, 2003
- Michael Kuchel
- G01 - MEASURING TESTING
Information Patent Application
Scanning interferometer for aspheric surfaces and wavefronts
- Publication number 20030002049
- Publication date Jan 2, 2003
- Michael Kuchel
- G01 - MEASURING TESTING

Michael Kuchel

Person

Patents Grantslast 30 patents

Scanning interferometric methods and apparatus for measuring aspher...

Two grating lateral shearing wavefront sensor

Scanning interferometric methods and apparatus for measuring aspher...

Low coherence grazing incidence interferometry for profiling and ti...

Scanning interferometer for aspheric surfaces and wavefronts

Scanning interferometer for aspheric surfaces and wavefronts

Reconfigurable interferometer system

Scanning interferometer for aspheric surfaces and wavefronts

Apparatus and method for calibrating an interferometer using a sele...

Scanning interferometer for aspheric surfaces and wavefronts

Rapid in situ mastering of an aspheric Fizeau with residual error c...

Dispersive null-optics for aspheric surface and wavefront metrology

Apparatus and method for phase-shifting interferometry

Rapid in-situ mastering of an aspheric fizeau

Method and apparatus for phase evaluation of pattern images used in...

Method for evaluating interferograms and interferometer therefor

Method for analyzing periodic brightness patterns

Method and apparatus for non-contact measuring of object surfaces

Method and apparatus for non-contact measuring of object surfaces

Method and apparatus for absolute interferometric testing of plane...

Optical distance-measuring device

Radiation source for partially coherent radiation

Interferometer for measuring optical phase differences

Patents Applicationslast 30 patents

TWO GRATING LATERAL SHEARING WAVEFRONT SENSOR

Scanning Interferometric Methods and Apparatus for Measuring Aspher...

Scanning interferometric methods and apparatus for measuring aspher...

Scanning interferometer for aspheric surfaces and wavefronts

Reconfigurable interferometer system

Low coherence grazing incidence interferometry systems and methods

Dispersive null-optics for aspheric surface and wavefront metrology

Scanning interferometer for aspheric surfaces and wavefronts

Apparatus and method for calibrating an interferometer using a sele...

Rapid in situ mastering of an aspheric fizeau with residual error c...

Rapid in-situ mastering of an aspheric fizeau

Scanning interferometer for aspheric surfaces and wavefronts

Scanning interferometer for aspheric surfaces and wavefronts