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Michael Kuehnl
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Muenchen, DE
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Patents Grants
last 30 patents
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Patent Grant
Automatic analysis apparatus
Patent number
11,740,254
Issue date
Aug 29, 2023
HITACHI HIGH-TECH CORPORATION
Yuichiro Ota
G01 - MEASURING TESTING
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Patent Grant
Method of monitoring an operation of detection of an analyte in a l...
Patent number
11,726,044
Issue date
Aug 15, 2023
Roche Diagnostics Operations, Inc.
Reinhold Kraemer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Diagnostic System, Automatic Analyzer, and Diagnostic Method
Publication number
20240280598
Publication date
Aug 22, 2024
Hitachi High-Tech Corporation
Shunsuke SASAKI
G01 - MEASURING TESTING
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Patent Application
Automatic Analysis Apparatus
Publication number
20200209273
Publication date
Jul 2, 2020
Yuichiro OTA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MONITORING AN OPERATION OF DETECTION OF AN ANALYTE IN A L...
Publication number
20200150046
Publication date
May 14, 2020
Roche Diagnostics Operations, Inc.
Reinhold Kraemer
G01 - MEASURING TESTING