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Michael L. Anderson
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San Jose, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Automatic multiplexing system for automated wafer testing
Patent number
7,576,550
Issue date
Aug 18, 2009
Qualitau, Inc.
Shahriar Mostarshed
G01 - MEASURING TESTING
Information
Patent Grant
Semi-automatic multiplexing system for automated semiconductor wafe...
Patent number
7,511,517
Issue date
Mar 31, 2009
Qualitau, Inc.
Shahriar Mostarshed
G01 - MEASURING TESTING
Information
Patent Grant
Vertical probe card and air cooled probe head system
Patent number
7,126,361
Issue date
Oct 24, 2006
QualiTau, Inc.
Michael L. Anderson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
AUTOMATIC MULTIPLEXING SYSTEM FOR AUTOMATED WAFER TESTING
Publication number
20080238451
Publication date
Oct 2, 2008
QUALITAU, INC.
Shahriar Mostarshed
G01 - MEASURING TESTING
Information
Patent Application
Semi-automatic multiplexing system for automated semiconductor wafe...
Publication number
20070103176
Publication date
May 10, 2007
QualiTau, Inc.
Shahriar Mostarshed
G01 - MEASURING TESTING