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Michael L. Burrows
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Lexington, MA, US
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last 30 patents
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Patent Grant
Super-resolution based on frequency domain interferometric processi...
Patent number
7,242,342
Issue date
Jul 10, 2007
Sparta, Inc.
Pei-Rin Wu
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Super-resolution based on frequency domain interferometric processi...
Publication number
20060077091
Publication date
Apr 13, 2006
SPARTA, INC.
Pei-Rin Wu
G01 - MEASURING TESTING