Michael L. Bushnell

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East Windsor, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Test generation for analog circuits using partitioning and inverted...
- Patent number 6,308,300
- Issue date Oct 23, 2001
- Rutgers University
- Michael L. Bushnell
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for combined stuck-at fault and partial-scanne...
- Patent number 6,247,154
- Issue date Jun 12, 2001
- Rutgers, The State University of New Jersey
- Michael L. Bushnell
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for identifying tested path delay faults
- Patent number 6,131,181
- Issue date Oct 10, 2000
- Rutgers University
- Michael Bushnell
- G01 - MEASURING TESTING
Information Patent Grant
Test generation using signal flow graphs
- Patent number 5,831,437
- Issue date Nov 3, 1998
- Rutgers University
- Rajesh Ramadoss
- G01 - MEASURING TESTING
Information Patent Grant
Robust delay fault built-in self-testing method and apparatus
- Patent number 5,422,891
- Issue date Jun 6, 1995
- Rutgers University
- Michael L. Bushnell
- G06 - COMPUTING CALCULATING COUNTING