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Michael L. Combs
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Essex Junction, VT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Testing and repair methodology for memories having redundancy
Patent number
7,222,274
Issue date
May 22, 2007
International Business Machines Corporation
Michael L. Combs
G11 - INFORMATION STORAGE
Information
Patent Grant
Parametric testing for high pin count ASIC
Patent number
7,010,733
Issue date
Mar 7, 2006
International Business Machines Corporation
Robert W. Bassett
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for reduced pin count package connection verif...
Patent number
6,931,346
Issue date
Aug 16, 2005
International Business Machines Corporation
Michael L. Combs
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for reduced pin count package connection verif...
Patent number
6,724,210
Issue date
Apr 20, 2004
International Business Machines Corporation
Michael L. Combs
G01 - MEASURING TESTING
Information
Patent Grant
Per-pin integrated circuit test system having n-bit interface
Patent number
5,127,011
Issue date
Jun 30, 1992
International Business Machines Corporation
Michael L. Combs
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TESTING AND REPAIR METHODOLOGY FOR MEMORIES HAVING REDUNDANCY
Publication number
20050188287
Publication date
Aug 25, 2005
International Business Machines Corporation
Michael L. Combs
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for reduced pin count package connection verif...
Publication number
20040153276
Publication date
Aug 5, 2004
Michael L. Combs
G01 - MEASURING TESTING
Information
Patent Application
Parametric testing for high pin count ASIC
Publication number
20040073856
Publication date
Apr 15, 2004
International Business Machines Corporation
Robert W. Bassett
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for reduced pin count package connection verif...
Publication number
20030038650
Publication date
Feb 27, 2003
Michael L. Combs
G01 - MEASURING TESTING