Michael L. KIRK

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Bloomfield, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Pulse and bias synchronization methods and systems
- Patent number 12,131,884
- Issue date Oct 29, 2024
- MKS Instruments, Inc.
- Mariusz Oldziej
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple radio frequency power supply control of frequency and phase
- Patent number 9,336,995
- Issue date May 10, 2016
- MKS Instruments, Inc.
- David J. Coumou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RF metrology characterization for field installation and serviceabi...
- Patent number 6,983,215
- Issue date Jan 3, 2006
- MKS Instruments, Inc.
- David J. Coumou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multirate processing for metrology of plasma RF source
- Patent number 6,707,255
- Issue date Mar 16, 2004
- ENI Technology, Inc.
- David J. Coumou
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Pulse And Bias Synchronization Methods And Systems
- Publication number 20230223235
- Publication date Jul 13, 2023
- MKS Instruments, Inc.
- Mariusz OLDZIEJ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiple Radio Frequency Power Supply Control of Frequency and Phase
- Publication number 20140320013
- Publication date Oct 30, 2014
- MKS Instruments, Inc.
- David J. COUMOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF metrology characterization for field installation and serviceabi...
- Publication number 20050119864
- Publication date Jun 2, 2005
- David J. Coumou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIRATE PROCESSING FOR METROLOGY OF PLASMA RF SOURCE
- Publication number 20040007984
- Publication date Jan 15, 2004
- David J. Coumou
- H03 - BASIC ELECTRONIC CIRCUITRY