Michael L. Scott

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Kensington, MD, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for determining defects in dielectric material...
- Patent number 10,788,584
- Issue date Sep 29, 2020
- Michael Leon Scott
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for high speed subsurface inspection of built...
- Patent number 9,915,729
- Issue date Mar 13, 2018
- Michael Leon Scott
- G01 - MEASURING TESTING
Information Patent Grant
Travel way measurement system
- Patent number 8,306,747
- Issue date Nov 6, 2012
- Starodub, Inc.
- Nicolas Gagarin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR DETERMINING DEFECTS IN DIELECTRIC MATERIAL...
- Publication number 20190064362
- Publication date Feb 28, 2019
- Michael Leon Scott
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR HIGH SPEED SUBSURFACE INSPECTION OF BUILT...
- Publication number 20170023671
- Publication date Jan 26, 2017
- Michael Leon Scott
- G01 - MEASURING TESTING
Information Patent Application
System and Method of Automated Civil Infrastructure Metrology for I...
- Publication number 20140336928
- Publication date Nov 13, 2014
- Michael L. Scott
- G01 - MEASURING TESTING